US2003127115A1PendingUtilityA1
Cleaning processes using hydrofluorocarbon and/or hydrochlorofluorocarbon compounds
Priority: Oct 29, 1999Filed: Feb 25, 2003Published: Jul 10, 2003
Est. expiryOct 29, 2019(expired)· nominal 20-yr term from priority
C11D 7/266C11D 7/5018B08B 7/0021C11D 7/264C11D 7/263H05K 3/26C11D 7/261C11D 7/5022Y10S134/902C11D 7/28C11D 7/30C11D 2111/22
48
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
Disclosed are methods of cleaning articles of manufacture using hydrofluorocarbon and hydrochlorofluorocarbon fluids. The methods comprise generally the steps of (a) providing a hydrofluorocarbon and/or hydrochlorofluorocarbon fluid in liquid or supercritical state; (b) contacting an article of manufacture with said fluid; and (c) removing substantially all of said fluid from said article of manufacture.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for cleaning an article of manufacture containing contaminants on a surface thereof comprising the steps of:
(a) providing a compound comprising 1,1,1,3,3-pentafluoropropane as a supercritical fluid; (b) contacting a surface of an article of manufacture containing contaminants with said supercritical fluid; and (c) removing substantially all of said supercritical fluid from said surface of the article of manufacture.
2 . The method of claim 1 wherein said supercritical fluid further comprises an oxygenate compound selected from the group consisting of aldehydes, ketones, esters, ethers and alcohols.
3 . The method of claim 2 wherein said oxygenate compound is an alcohol selected from the group consisting of methanol, ethanol, n-propanol, isopropanol, n-butanol, isobutanol and tert-butanol.
4 . The method of claim 1 wherein said supercritical fluid further comprises from about 0.1 wt % to about 0.9 wt % of methanol.
5 . The method of claim 1 wherein said supercritical fluid is a fluid in its liquid state.
6 . The method of claim 5 wherein said supercritical fluid is at or below about the critical temperature of 1,1,1,3,3-pentafluoropropane.
7 . The method of claim 5 wherein said supercritical fluid is at or below about the critical pressure of 1,1,1,3,3-pentafluoropropane.
8 . The method of claim 1 wherein said providing step (a) comprises providing said compound comprising 1,1,1,3,3-pentafluoropropane at a temperature of from about −10° C. to about 200° C.
9 . The method of claim 8 wherein said providing step (a) comprises providing said compound comprising 1,1,1,3,3-pentafluoropropane at a temperature of from about 15° C. to about 130° C.
10 . The method of claim 8 wherein said providing step (a) comprises providing said compound comprising 1,1,1,3,3-pentafluoropropane at a pressure of from about 25 psia to about 10,000 psia.
11 . The method of claim 9 wherein said providing step (a) comprises providing said compound comprising 1,1,1,3,3-pentafluoropropane at a pressure of from about 100 psia to about 3,500 psia.
12 . The method of claim 1 wherein said contacting step (b) comprises covering at least a contaminated portion of said article with said supercritical fluid.
13 . The method of claim 12 wherein said contacting step (b) further comprises dissolving in said supercritical fluid at least a portion of a contaminant on said contaminated portion of said article.
14 . The method of claim 1 wherein said contacting step (b) comprises immersing at least a contaminated portion of said article in a stream of said supercritical fluid.
15 . The method of claim 1 wherein said removing step (c) comprises converting said supercritical fluid to a gaseous state.
16 . The method of claim 15 wherein said step of converting said supercritical fluid to a gaseous state comprises changing the pressure to which the supercritical fluid is subjected.
17 . The method of claim 16 wherein said step of converting said supercritical fluid to a gaseous state further comprises changing the temperature of the supercritical fluid.
18 . The method of claim 1 wherein said article of manufacture comprises a printed circuit board.
19 . The method of claim 1 wherein said article of manufacture comprises a silicon wafer.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.