Ultra high throughput sampling and analysis systems and methods
Abstract
Ultra-high throughput systems and methods are used for sampling large numbers of different materials from surfaces of substantially planar library storage components. The systems and methods typically employ: microfluidic devices having integrated capillary elements for carrying out the analysis of the sampled materials; library storage components, e.g., planar solid substrates, capable of retaining thousands, tens of thousands and hundreds of thousands of different materials in small areas; sensing systems for allowing rapid and accurate sampling of the materials by the microfluidic devices, and associated instrumentation for control and analysis of the overall operation of these systems.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A sample substrate array, comprising:
a substrate having a first surface; and at least 100 separate test compound spots dried onto the first surface of the substrate, each test compound spot comprising a test compound and at least one excipient agent.
2 . The substrate array of claim 1 , wherein the at least 100 separate compounds spots are present at a density of at least about 100 compounds/cm 2 of substrate surface.
3 . The substrate array of claim 1 , wherein the at least 100 test compounds spots comprise at least 500 test compounds which are present at a density of at least about 500 compounds/cm 2 of substrate surface.
4 . The substrate array of claim 1 , wherein the at least 100 test compounds spots comprise at least 1000 test compounds which are present at a density of at least about 1000 compounds/cm 2 of substrate surface.
5 . The substrate array of claim 1 , wherein the first surface of the substrate has a surface area of at least 1 cm 2 .
6 . The substrate array of claim 1 , wherein the first surface of the substrate comprises at least 200 different compounds spots reversibly immobilized thereon in discrete regions.
7 . The substrate array of claim 1 , wherein the first surface of the substrate comprises at least 1000 different compound spots reversibly immobilized thereon in discrete regions.
8 . The substrate array of claim 1 , wherein the surface of the substrate comprises at least 10,000 different compound spots reversibly immobilized thereon in discrete regions.
9 . The substrate array of claim 1 , wherein the first surface of the substrate comprises a metal.
10 . The substrate array of claim 1 , wherein the substrate comprises glass or quartz.
11 . The substrate array of claim 1 , wherein the first surface of the substrate is nonconductive.
12 . The substrate array of claim 1 , wherein the first surface of the substrate is selected from a metal oxide, SiO 2 , Si 3 N 4 , siliconoxynitride and a polymeric material.
13 . The substrate array of claim 1 , wherein the first surface of the substrate is a polymeric material.
14 . The substrate array of claim 13 , wherein the polymeric material is selected from nitrocellulose, acrylic, polystyrene, parylene, polyvinylidine difluoride (PVDF), polysulfone, polyvinyl chloride, spun polypropylene, polytetrafluoroethylene (PTFE), and polycarbonate.
15 . The substrate array of claim 1 , wherein the at least one excipient agent is selected from a starch, dextran, glycol, polyethylene oxide, polyvinylpyrrolidone, a detergent, sucrose, fructose, maltose, and trehelose.
16 . A method of fabricating a sample substrate array, comprising:
providing a substrate having a first surface; depositing at least 100 separate test compounds on the first surface of the substrate; and freeze drying each of the at least 100 separate test compounds on the first surface.
17 . The method of claim 16 , wherein the at least 100 separate compounds are present at a density of at least about 100 compounds/cm 2 of substrate surface.
18 . The method of claim 16 , wherein the at least 100 test compounds comprise at least 500 test compounds which are present at a density of at least about 500 compounds/cm 2 of substrate surface.
19 . The method of claim 16 , wherein the at least 100 test compounds comprise at least 1000 test compounds which are present at a density of at least about 1000 compounds/cm 2 of substrate surface.
20 . The method of claim 16 , wherein the first surface of the substrate has a surface area of at least 1 cm 2 .
21 . The method of claim 16 , wherein the first surface of the substrate comprises at least 200 different compounds reversibly immobilized thereon in discrete regions.
22 . The method of claim 16 , wherein the first surface of the substrate comprises at least 1000 different compounds reversibly immobilized thereon in discrete regions.
23 . The method of claim 16 , wherein the first surface of the substrate comprises at least 10,000 different compounds reversibly immobilized thereon in discrete regions.
24 . The method of claim 16 , wherein the first surface of the substrate comprises a metal.
25 . The method of claim 16 , wherein the substrate comprises glass or quartz.
26 . The method of claim 16 , wherein the first surface of the substrate is nonconductive.
27 . The method of claim 16 , wherein the first surface of the substrate is selected from a metal oxide, SiO 2 , Si 3 N 4 , siliconoxynitride and a polymeric material.
28 . The method of claim 16 , wherein the first surface of the substrate is a polymeric material.
29 . The method of claim 28 , wherein the polymeric material is selected from nitrocellulose, acrylic, polystyrene, parylene, polyvinylidine difluoride (PVDF), polysulfone, polyvinyl chloride, spun polypropylene, polytetrafluoroethylene (PTFE), and polycarbonate.Cited by (0)
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