Automatic computer-system-level integrated circuit testing system and method

Abstract

An automatic computer-system-level IC testing system comprises a testing computer, an IC mounting/retrieving mechanism, a temperature regulator, and a control unit. The testing computer connects and tests the IC that is arranged in the testing computer and retrieved there from via the IC mounting/retrieving mechanism. The temperature regulator regulates the testing temperature the IC being tested. The control unit is connected to the testing computer and the IC mounting/retrieving mechanism to supervise the testing process. Once the IC to be tested in connected therein, the testing computer forms a complete computer system through the operation of which the testing is performed.

1 . An automatic computer-system-level integrated circuit (IC) testing system, comprising: 
 a testing computer, receiving at least an IC device to be tested, the testing computer with the IC device therein forming a complete computer system;    an IC mounting/retrieving mechanism, operated to place and connect the IC device in the testing computer and retrieve the IC device from the testing computer;    a first temperature regulator, regulating a testing temperature of the IC device; and    a control unit, connected to the testing computer and the IC mounting/retrieving mechanism to respectively control the operation of the IC mounting/retrieving mechanism and a testing procedure executed by means of the testing computer.    
     
     
         2 . The system of  claim 1 , wherein the testing computer includes a connector to which is connected the IC device.  
     
     
         3 . The system of  claim 1 , further including an image sensor that is connected to the control unit to monitor an image output of the testing computer.  
     
     
         4 . The system of  claim 1 , further including a sound sensor that is connected to the control unit to monitor an audio output of the testing computer.  
     
     
         5 . The system of  claim 1 , wherein the testing temperature of the IC device is regulated during the testing.  
     
     
         6 . The system of  claim 1 , wherein the first temperature regulator is mounted on the IC mounting/retrieving mechanism to regulate the temperature of one IC device being carried by the IC mounting/retrieving mechanism.  
     
     
         7 . The system of  claim 1 , wherein the first temperature regulator is mounted to the testing computer to regulate the testing temperature of the IC device being tested.  
     
     
         8 . The system of  claim 1 , wherein the IC mounting/retrieving mechanism includes a robotic arm.  
     
     
         9 . The system of  claim 1 , further including: 
 an IC supplying station, receiving a plurality of IC devices to be tested;    an IC sorting station, receiving IC devices that have been tested; and    an IC conveyance mechanism, conveying the IC devices respectively between the testing computer and the IC supplying station, and between the testing computer and the IC sorting station, wherein by means of the IC conveyance mechanism and the IC mounting/retrieving mechanism, one IC device that is to be tested is transferred from the IC supplying station to the testing computer, and one IC device that has been tested is transferred from the testing computer to the IC sorting station.    
     
     
         10 . The system of  claim 19 , further respectively including a temperature regulating station that regulates the temperature of one IC device to be tested before the IC device is transferred to the testing computer, the first temperature regulator being mounted on the IC mounting/retrieving mechanism to regulate the temperature of one IC device being carried by the IC mounting/retrieving mechanism.  
     
     
         11 . The system of  claim 1 , wherein the first temperature regulator is mounted to a temperature regulating station to regulate the temperature of one IC device to be tested placed therein before being transferred to the testing computer.  
     
     
         12 . A computer-system-level IC testing system, comprising: 
 a testing computer, receiving at least an integrated circuit (IC) device to be tested, the testing computer with the IC device received therein forming a complete computer system to execute a testing procedure;    a first temperature regulator, regulating a testing temperature of the IC device; and    an output device, used to indicate an operating state of the testing computer when the testing computer runs the testing procedure, thereby evaluating a testing result of the IC device.    
     
     
         13 . The system of  claim 12 , further including a connector through which one IC device is electrically connected to the testing computer.  
     
     
         14 . The system of  claim 12 , wherein the IC device comprises at least one of the following devices: a central processor unit (CPU), a system bus controller, an input/output (I/O) bus controller, and a graphics accelerator.  
     
     
         15 . A computer-system-level IC testing method, comprising: 
 placing and electrically connecting an IC device in a testing computer so that the testing computer forms a complete computer system;    regulating a testing temperature of the IC device in the testing computer;    by means of the testing computer, executing a testing procedure for testing the IC device; and    obtaining a testing result by evaluating an operating state of the testing computer to detect whether the tested IC device is normally operating.    
     
     
         16 . The method of  claim 15 , wherein placing and electrically connecting an IC device in a testing computer is performed by means of an IC conveyance mechanism and an IC mounting/retrieving mechanism that transfer the IC device to be tested from an IC supplying station to the testing computer.  
     
     
         17 . A temperature regulating system used for computer-system-level testing an IC device, comprising: 
 a first temperature regulator, regulating the temperature of the IC device before the IC device is tested; and    a second temperature regulator, regulating the testing temperature of the IC device being tested.    
     
     
         18 . The system of  claim 17 , further including a third temperature regulator to control the temperature of the IC device when the IC device is transferred from a standby location for IC testing to a testing location.  
     
     
         19 . The system of  claim 17 , further including a control unit used to control the first and second temperature regulators.  
     
     
         20 . The system of  claim 17 , wherein the IC device is tested via a complete computer system with the tested IC device incorporated therein.