Nanospot welder and method

Abstract

A method and apparatus for assembly of small structures is disclosed. The present invention discloses electron beams created from one or more nanotips in an array operated in a field emission mode that can be controlled to apply heat to very well defined spots. The multiple electron beams may be generated and deflected and applied to electron beam heating and welding applications.

What is claimed is:  
     
         1 . An apparatus comprising: 
 an electron beam source positioned a distance from a work piece to be welded; and    a power supply for causing a beam of electrons to emit from the electron beam source towards the work piece causing local heating at a desired spot on the work piece to thereby create a weld joint on the work piece.    
     
     
         2 . The apparatus as recited in  claim 1 , wherein the electron beam source is a scanning probe microscope.  
     
     
         3 . The apparatus as recited in  claim 1 , wherein the electron beam source is an AFM microtip probe.  
     
     
         4 . The apparatus as recited in  claim 1 , wherein the electron beam source is a STM microtip probe.  
     
     
         5 . The apparatus as recited in  claim 1 , wherein the electron beam source is a hopping electron cathode.  
     
     
         6 . An apparatus comprising: 
 a printed circuit board supporting a plurality of electron beam sources; and    circuitry for activating the plurality of electron beam sources to each emit an electron beam to create a plurality of weld joints on a work piece positioned a distance from the printed circuit board.    
     
     
         7 . The apparatus as recited in  claim 6 , wherein the electron beam source is a scanning probe microscope.  
     
     
         8 . The apparatus as recited in  claim 6 , wherein the electron beam source is an AFM microtip probe.  
     
     
         9 . The apparatus as recited in  claim 6 , wherein the electron beam source is a STM microtip probe.  
     
     
         10 . The apparatus as recited in  claim 6 , wherein the electron beam source is a hopping electron cathode.  
     
     
         11 . The apparatus as recited in  claim 6 , wherein the work piece is movable relative to the printed circuit board.  
     
     
         12 . The apparatus as recited in  claim 6 , wherein the plurality of electron beam sources are activated in parallel.  
     
     
         13 . The apparatus as recited in  claim 6 , wherein the plurality of electron beam sources are arranged in an array on the printed circuit board.  
     
     
         14 . A method for creating a weld joint comprising the steps of 
 positioning an electron beam source a distance from a work piece; and    activating the electron beam source to emit an electron beam to a spot on the work piece to create the weld joint at the spot on the work piece.    
     
     
         15 . The apparatus as recited in  claim 14 , wherein the electron beam source is a scanning probe microscope.  
     
     
         16 . The apparatus as recited in  claim 14 , wherein the electron beam source is an AFM microtip probe.  
     
     
         17 . The apparatus as recited in  claim 14 , wherein the electron beam source is a STM microtip probe.  
     
     
         18 . The apparatus as recited in  claim 14 , wherein the electron beam source is a hopping electron cathode.  
     
     
         19 . An apparatus as recited in  claim 18 , wherein the electron source is separated from the work piece by the HEC funnel array and additional chamber walls.