US2005089210A1PendingUtilityA1
Flatness measurement system for metal strip
Priority: Mar 11, 1997Filed: Oct 2, 2003Published: Apr 28, 2005
Est. expiryMar 11, 2017(expired)· nominal 20-yr term from priority
B21B 38/006B21B 45/0218B21B 37/54B21B 38/04B21B 38/02G01B 11/306B21B 37/44B21B 37/42B21B 37/76
40
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Claims
Abstract
The invention relates to a flatness measurement and control system for metal strip, which makes it possible to obtain improved strip or coil quality by a simple and effective measurement of departures from flatness and to control the finishing parameters through the evaluation of a line pattern on the strip surface or on the end face of a coil as it is coiled.
Claims
exact text as granted — not AI-modified1 - 7 . (canceled)
8 . A method for continuously measuring the flatness of a moving hot metal strip, the method comprising projecting a shadow in the form of a line pattern onto said moving hot metal strip, and detecting said line pattern on said moving hot metal strip with a camera.
9 . The method of claim 8 , wherein said line pattern detected by said camera is compared continuously by a computer with a reference pattern.
10 . The method of claim 8 , wherein said line pattern detected by said camera is used for control of a finishing train.
11 . A method for continuously measuring the flatness of an end face of a coil when coiling a metal strip, the method comprising the steps of projecting a shadow in the form of a line pattern onto said end face, and detecting said line pattern on said end face with a camera.
12 . The method of claim 11 , wherein said line pattern detected by said camera is compared continuously by a computer with a reference pattern.
13 . The method of claim 11 , wherein said line pattern detected by said camera is used for control of a finishing train.
14 . A method according to claim 8 , wherein projecting a shadow comprises using a projector to project through a slide.
15 . A method according to claim 11 , wherein projecting a shadow comprises using a projector through a slide.Cited by (0)
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