US2005094281A1PendingUtilityA1
Radiation conditioning system
Est. expiryDec 19, 2021(expired)· nominal 20-yr term from priority
G03H 2001/2292G02B 30/27G03H 2225/31G03H 1/268H04N 13/302G03H 2210/454G02B 5/32G02B 26/106G03H 1/04G02B 27/10
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Claims
Abstract
A radiation conditioning system is presented as comprising a radiation source for generating radiation, a spatial light modulator receptive of the radiation from the radiation source, a control signal for addressing the spatial light modulator, and a radiation conditioning device of the radiation field from the spatial light modulator for conditioning the radiation field.
Claims
exact text as granted — not AI-modified1 - 26 . (canceled)
27 . A radiation conditioning system comprising:
a radiation source for generating radiation; a spatial light modulator receptive of the radiation from the radiation source and a control signal for addressing the spatial light modulator, thereby projecting a radiation field from the spatial light modulator; and a radiation conditioning device receptive of the radiation field from the spatial light modulator for conditioning the radiation field; wherein the radiation conditioning device includes a plurality of radiation conditioning regions.
28 . The radiation conditioning system as set forth in claim 27 wherein the radiation conditioning device comprises a diffractive optical element.
29 . The radiation conditioning system as set forth in claim 28 wherein the diffractive optical element comprises a diffraction grating.
30 . The radiation conditioning system as set forth in claim 29 wherein the diffraction grating comprises a set of basis fringes.
31 . The radiation conditioning system as set forth in claim 29 wherein the diffraction grating comprises grating pattern having a spatial frequency defined by the mathematical equation:
f=A sin(θ)+ B
wherein f is the spatial frequency of the grating pattern, A is scaling factor that determines the ratio of maximum to minimum diffraction grating frequencies, θ is a spatial dimension and B is a carrier frequency offset factor.
32 . The radiation conditioning system as set forth in claim 30 wherein the diffractive optical element comprises a disc.
33 . The radiation conditioning system as set forth in claim 28 wherein the diffractive optical element comprises an acousto-optic modulator.
34 . The radiation conditioning system set forth in claim 27 wherein the radiation conditioning device comprises a set of lenslets.
35 . The radiation conditioning system set forth in claim 27 wherein the set of lenslets comprise an array.
36 . The radiation conditioning system set forth in claim 27 wherein the set of lenslets are arranged in a rectangular host.
37 . The radiation conditioning system set forth in claim 27 wherein the rectangular host is in reciprocating motion.
38 . The radiation conditioning system set forth in claim 27 wherein the radiation conditioning device comprises a spatial light modulator.
39 . The radiation conditioning system set forth in claim 38 wherein the spatial light modulator comprises an optically addressable spatial light modulator.
40 . The radiation conditioning system set forth in claim 39 wherein the optically addressable spatial light modulator includes a material having properties depending upon a first illumination frequency and is read out at a second frequency.
41 . A radiation conditioning device comprising:
a diffractive optical element including a diffraction grating comprising a set of basis fringes.
42 . The radiation conditioning device as set forth in claim 41 wherein the diffraction grating comprises grating pattern having a spatial frequency defined by the mathematical equation:
f=A sin(θ)+ B
wherein f is the spatial frequency of the grating pattern, A is scaling factor that determines the ratio of maximum to minimum diffraction grating frequencies, θ is a spatial dimension and B is a carrier frequency offset factor.
43 . A method of conditioning a radiation field, the method comprising:
conditioning the radiation field by scanning the radiation field with a radiation conditioning device comprising a set of basis fringes.
44 . The method as set forth in claim 43 further comprising decomposing the radiation field into a set of components.
45 . The method as set forth in claim 43 wherein the radiation conditioning device comprises a diffractive optical element.
46 . The method as set forth in claim 43 wherein conditioning the radiation field comprises scanning the radiation field with a diffraction grating having a grating pattern defined by the mathematical equation:
f=A sin(θ)+ B
wherein f is the spatial frequency of the grating pattern, A is scaling factor that determines the ratio of maximum to minimum diffraction grating frequencies, θ is a spatial dimension and B is a carrier frequency offset factor.
47 . The method as set forth in claim 45 wherein scanning the radiation field comprises rotating the radiation conditioning device through a prescribed angular distance.
48 . The method as set forth in claim 45 wherein scanning the radiation field comprises rotating the diffraction grating through a prescribed angular distance.
49 . A method of conditioning a radiation field, the method comprising:
conditioning the radiation field by scanning the radiation field with a radiation conditioning device having time varying properties.
50 . A radiation conditioning system comprising:
a radiation projector for projecting a radiation field; and a radiation conditioning device receptive of the radiation field from the radiation projector for conditioning the radiation field; wherein the radiation conditioning device includes a plurality of radiation conditioning regions.
51 . The system as set forth in claim 50 wherein the radiation conditioning device comprises a set of basis fringes.
52 . A radiation conditioning device comprising:
a diffractive optical element comprising a diffraction grating comprising a set of basis fringes; wherein the diffraction grating comprises a grating pattern having a spatial frequency defined by the mathematical equation: f=A sin(θ)+ B and wherein f is the spatial frequency of the grating pattern, A is a scaling factor that determines a ratio of maximum to minimum diffraction grating frequencies, θ is a spatial dimension and B is a carrier frequency offset factor.Join the waitlist — get patent alerts
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