Ultrahigh resolution multi-color colocalization of single fluorescent probes
Abstract
A novel optical ruler based on ultrahigh-resolution colocalization of single fluorescent probes is described. Two unique families of fluorophores are used, namely energy-transfer fluorescent beads and semiconductor nanocrystal (NC) quantum dots, that can be excited by a single laser wavelength but emit at different wavelengths. A novel multicolor sample-scanning confocal microscope was constructed which allows one to image each fluorescent light emitter, free of chromatic aberrations, by scanning the sample with nanometer scale steps using a piezo-scanner. The resulting spots are accurately localized by fitting them to the known shape of the excitation point-spread-function of the microscope.
Claims
exact text as granted — not AI-modified1 - 20 . (canceled)
21 . A apparatus for the colocalization of two or more species of interest in a sample comprising:
a scanner capable of supporting a sample and moving the sample; a single wavelength light source capable of exciting the sample; a device capable of separating the respective distinctive emission characteristics of the two or more species of interest; and a device capable of detecting the emitted light from the two or more species of interest.
22 . The apparatus of claim 21 , where the device capable of detecting the emitted light from the two or more species of interest detects emitted light simultaneously.
23 . The apparatus of claim 21 , where the light source is a laser.
24 . The apparatus of claim 23 , where the light source is a laser with wavelengths and power capable of exciting single photon processes.
25 . The apparatus of claim 23 , where the light source is a laser with wavelengths and power capable of exciting multiple photon processes.
26 . The apparatus of claim 21 , where the scanner is capable of moving a predetermined distance of from about 1 angstrom up to a distance of about 10 microns.
27 . The apparatus of claim 21 , where the scanner is capble of moving a predetermined distance of about 25 nm.
28 . The apparatus of claim 21 , where the device capable of detecting emitted light is a photodiode or a charge coupled device.
29 . The apparatus of claim 23 , where the laser is a pulsed laser.
30 - 31 . (canceled)
32 . The apparatus of claim 21 , where the scanner is a closed-loop, 3 axis, piezo-scanner.
33 . The apparatus of claim 21 , where the scanner is an open-loop scanner.
34 . The apparatus of claim 21 , where the scanner performs a two dimensional scan.
35 . The apparatus of claim 21 , where the scanner performs a three dimensional scan.
36 . The apparatus of claim 21 , wherein there is included a confocal pinhole.
37 - 40 . (canceled)
41 . The apparatus of claim 21 , where the device capable of detecting the emitted light is a point detector.Cited by (0)
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