US2005161689A1PendingUtilityA1

Efficient light emitting diodes and lasers

42
Assignee: KOPIN CORPPriority: Feb 25, 2002Filed: Dec 6, 2004Published: Jul 28, 2005
Est. expiryFeb 25, 2022(expired)· nominal 20-yr term from priority
H10H 20/812H10H 20/825H01S 5/3425H01S 5/106H01S 5/34333B82Y 20/00
42
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Claims

Abstract

An optoelectronic device such as an LED or laser which produces spontaneous emission by recombination of carriers (electrons and holes) trapped in Quantum Confinement Regions formed by transverse thickness variations in Quantum Well layers of group III nitrides.

Claims

exact text as granted — not AI-modified
1 . An optoelectronic device comprising: 
 a substrate; and    multiple quantum well (MQW) layers formed of Group III nitrides in which carriers recombine to emit photons, the layers being formed over the substrate and wherein the layers periodically vary in thickness along a continuous length thereof.    
     
     
         2 . The device of  claim 1 , wherein the layers have stress induced dislocations and the thickness variations result in the formation of quantum confinement regions which are smaller than separations between the stress induced dislocations.  
     
     
         3 . The device of  claim 2 , wherein the quantum confinement regions trap the carriers, which recombine to produce the photons for efficient spontaneous emissions.  
     
     
         4 . The device of  claim 1 , including contacts formed on the device and a voltage source coupled to the contacts to enable the device to operate as a high efficiency LED.  
     
     
         5 . The device of  claim 1 , including a feedback mirror to produce coherent light.  
     
     
         6 . The device of  claim 1  in which the MQWs are formed of layers of In x Ga (1−x) N and GaN.  
     
     
         7 . The device of  claim 1  in which the MQWs are formed of layers of Al y In x Ga (1−x−y) N and Al z Ga (1−z) N.  
     
     
         8 . The device of  claim 1  in which the substrate is formed of a compound from the class of Al 2 O 3 , Si, SiC, GaN or AIN or alloys thereof.  
     
     
         9 . The device of  claim 1  in which the thickness variation is a relatively short longitudinal range on the order of 2 to 10 nanometers (nm).  
     
     
         10 . The device of  claim 9  having an additional long-range thickness variation in the order of 50 to 200 nm and thickness variation more than 10%.  
     
     
         11 . The device of  claim 9  having an additional long-range thickness variation more than 10%.  
     
     
         12 . The device of  claim 9  having a long-range thickness variation period less than the separation of dislocations.  
     
     
         13 . An LED comprising: 
 a substrate; and    multiple quantum well (MQW) layers formed of Group III nitrides in which carriers recombine to emit photons, the layers being formed over the substrate and wherein the layers periodically vary in thickness along a continuous length thereof.    
     
     
         14 . The device of  claim 13 , wherein the layers have stress induced dislocations and the thickness variations result in the formation of quantum confinement regions which are smaller than separations between the stress induced dislocations.  
     
     
         15 . The device of  claim 13 , wherein the quantum confinement regions trap the carriers, which recombine to produce the photons for efficient spontaneous emission.  
     
     
         16 . The LED of  claim 13 , wherein the substrate is formed of A 1   2 O 3 , the quantum well layers are formed of InGaN/GaN, an n GaN is formed between the A 1   2 O 3  and quantum well layers, and a p GaN is formed over the quantum well layers.  
     
     
         17 . An optoelectronic device comprising: 
 a substrate; and    multiple quantum well (MQW) layers formed of Group III nitrides in which carriers recombine to emit photons, the layers being formed over the substrate and wherein the layers periodically vary in thickness along a length thereof, where the layers have stress induced dislocations and the thickness variations result in the formation of quantum confinement regions which are smaller than separations between the stress induced dislocations.    
     
     
         18 . The device of  claim 17 , wherein the quantum confinement regions trap the carriers, which recombine to produce the photons for efficient spontaneous emissions.  
     
     
         19 . An optoelectronic device comprising: 
 a substrate; and    multiple quantum well (MQW) layers formed of Group III nitrides in which carriers recombine to emit photons, the layers being formed over the substrate and wherein the layers periodically vary in thickness along a length thereof, where the thickness variation is a relatively short longitudinal range on the order of 2 to 10 nanometers (nm).    
     
     
         20 . The device of  claim 19 , having an additional long-range thickness variation in the order of 50 to 200 nm and thickness variation more than 10%.  
     
     
         21 . The device of  claim 19 , having an additional long-range thickness variation more than 10%.  
     
     
         22 . The device of  claim 19 , having a long-range thickness variation period less than the separation of dislocations.  
     
     
         23 . An LED comprising: 
 a substrate; and    multiple quantum well (MQW) layers formed of Group III nitrides in which carriers recombine to emit photons, the layers being formed over the substrate and wherein the layers periodically vary in thickness along a length thereof, where the layers have stress induced dislocations and the thickness variations result in the formation of quantum confinement regions which are smaller than separations between the stress induced dislocations.    
     
     
         24 . The device of  claim 23 , wherein the quantum confinement regions trap the carriers, which recombine to produce the photons for efficient spontaneous emission.

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