US2005194096A1PendingUtilityA1
Method and apparatus for semiconductor processing
Est. expiryAug 29, 2023(expired)· nominal 20-yr term from priority
H10P 72/3402H10P 72/3302H10P 72/0454H10P 72/0452H10P 72/0458Y10S414/139
40
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Claims
Abstract
A method and apparatus for semiconductor processing is disclosed. In one embodiment, a method of transporting a wafer within a cluster tool, comprises placing the wafer into a first segment of a vacuum enclosure, the vacuum enclosure being attached to a processing chamber and a factory interface. The wafer is transported to a second segment of the vacuum enclosure using a vertical transport mechanism, wherein the second segment is above or below the first segment.
Claims
exact text as granted — not AI-modified1 . A method of transporting a wafer within a cluster tool, comprising:
placing the wafer into a first segment of a vacuum enclosure, the vacuum enclosure being attached to a processing chamber and a factory interface; transporting the wafer to a second segment of the vacuum enclosure using a vertical transport mechanism, wherein the second segment is above or below the first segment.
2 . The method of claim 1 , further comprising:
moving the wafer into and out of the vacuum enclosure using a linear wafer drive, wherein the linear wafer drive is external to the vacuum enclosure.
3 . The method of claim 2 , further comprising:
controlling the linear wafer drive and the vertical transport mechanism with a computer executing processing control software.
4 . The method of claim 3 , wherein moving the wafer includes moving the wafer through a gate valve.
5 . The method of claim 3 , wherein moving the wafer includes moving the wafer between the vacuum enclosure and the processing chamber.
6 . The method of claim 3 , wherein moving the wafer includes moving the wafer between the vacuum enclosure and a second vacuum enclosure.
7 . A method of transporting a wafer within a cluster tool, comprising:
moving the wafer between a vacuum enclosure and a processing chamber using a linear wafer drive, wherein the linear wafer drive is external to the vacuum enclosure and the processing chamber.
8 . The method of claim 7 , further comprising:
controlling the linear wafer drive with a computer executing processing control software.
9 . The method of claim 7 , wherein moving the wafer includes moving the wafer through a gate valve.
10 . The method of claim 7 , wherein moving the wafer includes moving the wafer between the vacuum enclosure and the processing chamber.
11 . The method of claim 7 , wherein moving the wafer includes moving the wafer between the vacuum enclosure and a second vacuum enclosure.
12 . The method claim 7 , wherein the linear drive is disposed between the vacuum enclosure and the processing chamber.
13 . The method of claim 12 , further comprising simultaneously transporting a fresh wafer from the vacuum enclosure and a processed wafer from the processing chamber into the linear wafer drive.
14 . The method of claim 13 , further comprising rotating the fresh wafer and the processed wafer within the linear wafer drive.
15 . The method of claim 14 , further comprising simultaneously transporting the fresh wafer into the processing chamber and the processed wafer into the vacuum enclosure.
16 . The method of claim 12 , further comprising transporting the wafer from the vacuum enclosure into the linear wafer drive.
17 . The method of claim 16 , further comprising rotating the wafer within the linear wafer drive.
18 . The method of claim 17 , further comprising transporting the wafer from the linear wafer drive into the processing chamber.
19 . A cluster tool, comprising:
a vacuum enclosure; a linear drive attached to the vacuum enclosure; and a processing chamber, wherein the vacuum enclosure includes a vertical transport mechanism that carries a wafer from a lower segment of the vacuum enclosure to an upper segment of a vacuum enclosure.
20 . A vacuum processing system comprising:
at least one wafer transport operating vertically through an assembly of end-to-end flanged chamber sections; a load-lock system between two of the end-to-end flanged chamber sections acting to bring wafers from outside the system into the vacuum processing system; and a processing module between two of the end-to-end flanged chamber sections including at least one horizontal linear transport mechanisms for trading wafers horizontally between the vertical wafer transport and a processing chamber, through isolation valves.Cited by (0)
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