US2005199584A1PendingUtilityA1
Decal transfer microfabrication
Est. expiryAug 28, 2022(expired)· nominal 20-yr term from priority
G03F 7/00B32B 3/00B81C 2201/034B82Y 40/00B82Y 10/00Y10T428/24562Y10T428/24628B81C 1/0046G03F 7/0002
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Claims
Abstract
A method of making a microstructure includes forming a pattern in a surface of a silicon-containing elastomer, oxidizing the pattern, contacting the pattern with a substrate; and bonding the oxidized pattern and the substrate such that the pattern and the substrate are irreversibly attached. The silicon-containing elastomer may be removably attached to a transfer pad.
Claims
exact text as granted — not AI-modified1 - 48 . (canceled)
49 . A microstructure, comprising:
a substrate; and a patterned layer comprising a silicon-containing elastomer on the substrate; wherein the microstructure is formed by oxidizing the silicon-containing elastomer, contacting the oxidized elastomer with the substrate, and bonding the oxidized elastomer and the substrate such that the elastomer and substrate are irreversibly attached.
50 . The microstructure of claim 49 , wherein a minimum feature size of the patterned layer is between 1 nanometer and 500 micrometers.
51 . The microstructure of claim 49 , wherein a minimum feature size of the patterned layer is between 10 nm and 100 micrometers.
52 . The microstructure of claim 49 , wherein the patterned layer comprises a discontinuous pattern.
53 . The microstructure of claim 49 , further comprising a top layer comprising a silicon-containing elastomer, wherein the patterned layer is positioned between the substrate and the top layer.
54 . The microstructure of claim 53 , wherein the patterned layer further defines channels between the substrate and the top layer.
55 . The microstructure of claim 53 , wherein the top layer has a thickness between 100 nanometers and 500 micrometers.
56 . The microstructure of claim 53 , wherein the top layer has a thickness between 500 nanometers and 100 micrometers.
57 . The microstructure of claim 53 , further comprising a second top layer comprising a silicon-containing elastomer disposed over said top layer and a second patterned layer comprising a silicon-containing elastomer positioned between said top layer and the second top layer.
58 . The microstructure of claim 49 , wherein the substrate is non-planar.
59 . The microstructure of claim 58 , wherein the substrate is curved.
60 - 64 . (canceled)
65 . A microstructure, comprising:
a substrate; a patterned layer comprising a silicon-containing elastomer on the substrate; and a top layer comprising a silicon-containing elastomer; wherein the patterned layer is positioned between the substrate and the top layer and further defines channels between the substrate and the top layer; and wherein the top layer has a thickness between 100 nanometers and 500 micrometers.
66 . The microstructure of claim 65 , wherein the top layer has a thickness between 500 nanometers and 100 micrometers.
67 . The microstructure of claim 65 , further comprising a second top layer comprising a silicon-containing elastomer disposed over said top layer and a second patterned layer comprising a silicon-containing elastomer positioned between said top layer and the second top layer.
68 . The microstructure of claim 65 , wherein the substrate is non-planar.
69 . The microstructure of claim 65 , wherein the patterned layer and the substrate are irreversibly attached.
70 . A microstructure, comprising:
a substrate; and a patterned layer comprising a silicon-containing elastomer on the substrate; wherein the patterned layer comprises a discontinuous pattern having a minimum feature size less than 1,000 micrometers and having a thickness between 10 nanometers and 1 micrometer.
71 . The microstructure of claim 70 , wherein the discontinuous pattern has a minimum feature size between 1 nanometer and 500 micrometers.
72 . The microstructure of claim 70 , wherein the discontinuous pattern has a minimum feature size between 10 nanometers and 100 micrometers.
73 . The microstructure of claim 70 , wherein the discontinuous pattern has a minimum feature size between 10 nanometers and 1 micrometer.
74 . The microstructure of claim 70 , wherein the discontinuous pattern has a thickness between 10 nanometers and 100 nanometers.
75 . The microstructure of claim 70 , wherein the patterned layer and the substrate are irreversibly attached.
76 . A microstructure, comprising:
a non-planar substrate; and a patterned layer comprising a silicon-containing elastomer on the substrate; wherein a minimum feature size of the patterned layer is less than 1,000 micrometers.
77 . The microstructure of claim 76 , wherein the minimum feature size of the patterned layer is between 1 nanometer and 500 micrometers.
78 . The microstructure of claim 76 , wherein the minimum feature size of the patterned layer is between 10 nm and 100 micrometers.
79 . The microstructure of claim 76 , wherein the patterned layer and the substrate are irreversibly attached.
80 . The microstructure of claim 76 , wherein the substrate is curved.Cited by (0)
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