In vivo imaging device with a small cross sectional area

Abstract

An image sensor (e.g., a CMOS sensor) includes a pixel array portion and a circuitry portion, where the circuitry portion may be segregated, for example longitudinally, from the pixel array portion.

1 . A CMOS image sensor comprising a pixel array portion and a circuitry portion, said circuitry portion being longitudinally segregated from the pixel array portion.  
     
     
         2 . The CMOS image sensor according to  claim 1  wherein the pixel array portion is continuous with the circuitry portion.  
     
     
         3 . The CMOS image sensor according to  claim 1  wherein the circuitry portion comprises circuitry selected from the group consisting of timing circuitry, analog to digital conversion circuitry, input/output (I/O) circuitry, transmitting circuitry or a combination thereof.  
     
     
         4 . An in vivo imaging device comprising: 
 a housing having a longitudinal axis, said housing accommodating a CMOS image sensor according to  claim 1 , said image sensor disposed substantially parallel to the longitudinal axis of the housing; and    a light deflecting element positioned to intercept reflected light and configured to deflect the reflected light to the pixel array.    
     
     
         5 . The device according to  claim 4  wherein the light deflecting element is positioned at substantially 45° to the pixel array.  
     
     
         6 . The device according to  claim 4  wherein the light deflecting element is a mirror.  
     
     
         7 . The device according to  claim 4  further comprising an optical system, said system configured for changing an image to compensate for distortion of an image by the light deflecting element.  
     
     
         8 . The device according to  claim 4  further comprising an aperture for reflected light to progress through.