Concurrent scanning non-invasive analysis system

Abstract

A non-invasive imaging and analysis system suitable for measuring concentrations of specific components, such as blood glucose concentration and suitable for non-invasive analysis of defects or malignant aspects of targets such as cancer in skin or human tissue, includes an optical processing system which generates a probe and composite reference beam. The system also includes a means that applies the probe beam to the target to be analyzed and modulates at least some of the components of the composite reference beam by means of a micro-mirror array, such that signals corresponding to different depths within the target can be separated by electronic processing. The system combines a scattered portion of the probe beam and the composite beam interferometrically to concurrently acquire information from multiple depths within a target. It further includes electronic control and processing systems.

1 . A method for non-invasive analysis of a target comprising: 
 generating a probe beam and a reference beam;    separating the reference beam into multiple component reference beams;    modulating at least some of the multiple component reference beams;    re-combining at least part of some of the multiple component reference beams to form a composite reference beam;    applying the probe beam to the target to be analyzed;    capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;    combining the captured scattered probe radiation and the composite reference beam;    detecting the resulting composite interferometric signal to form a composite electronic signal;    separating the composite electronic signal into signals related to concurrent information from different locations within the target; and    processing said concurrent information to achieve non-invasive analysis of the target.    
     
     
         2 . The method of  claim 1 , wherein the probe and reference beams are generated by at least one super-luminescent diode.  
     
     
         3 . The method of  claim 1 , wherein the probe and reference beams are generated by at least one source of broadband radiation.  
     
     
         4 . The method of  claim 1 , wherein the reference beam is separated into component reference beams by at least one beam-splitter.  
     
     
         5 . The method of  claim 1 , wherein the reference beam is separated into component reference beams by a partially reflective element.  
     
     
         6 . The method of  claim 1 , wherein the reference beam is separated into component reference beams by a MEMS based mirror array.  
     
     
         7 . The method of  claim 1 , wherein at least one component reference beam is modulated by the motion of at least one micro-mirror of the MEMS based mirror array.  
     
     
         8 . The method of  claim 1 , wherein at least one component reference beam is modulated by sequentially switching micro-mirrors at least some of which have a large physical separation.  
     
     
         9 . The method of  claim 1 , wherein at least one component reference beam is modulated by the motion of the MEMS based mirror array.  
     
     
         10 . The method of  claim 1 , wherein at least some of the different component reference beams are modulated in a manner that results in interferometric signals with different frequency content.  
     
     
         11 . The method of  claim 1 , wherein at least some of the different component reference beams are modulated in a manner that results in interferometric signals that occur at different time intervals.  
     
     
         12 . The method of  claim 1 , wherein the signals related to different component reference beams are separated by electronic processing of the detected composite electronic signal.  
     
     
         13 . The method of  claim 1 , wherein the concurrent information from different locations within the target is processed to provide scattering information.  
     
     
         14 . The method of  claim 13 , wherein the scattering information is analyzed to determine a measurement of an analyte.  
     
     
         15 . The method of  claim 14 , wherein the measurement of an analyte is the concentration level of glucose in tissue.  
     
     
         16 . The method of  claim 1 , wherein the concurrent information from different locations is analyzed to provide imaging information.  
     
     
         17 . A system for non-invasive analysis of a target, said system comprising: 
 means for generating a probe beam and a reference beam;    means for separating the reference beam into multiple component reference beams;    means for modulating at least some of the multiple component reference beams;    means for re-combining at least part of some of the multiple component reference beams to form a composite reference beam;    means for applying the probe beam to the target to be analyzed;    means for capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;    means for combining the captured scattered probe radiation and the composite reference beam;    means for detecting the resulting composite interferometric signal to form a composite electronic signal;    means for separating the composite electronic signal into signals related to concurrent information from different locations within the target; and    means for processing said concurrent information to achieve non-invasive analysis of the target.    
     
     
         18 . An apparatus for non-invasive analysis of a target, said apparatus comprising: 
 means for generating a probe beam and a reference beam;    means for separating the reference beam into multiple component reference beams;    means for modulating at least some of the multiple component reference beams;    means for re-combining at least part of some of the multiple component reference beams to form a composite reference beam;    means for applying the probe beam to the target to be analyzed;    means for capturing at least part of said probe beam scattered from within the target to form captured scattered probe radiation;    means for combining the captured scattered probe radiation and the composite reference beam;    means for detecting the resulting composite interferometric signal to form a composite electronic signal;    means for separating the composite electronic signal into signals related to concurrent information from different locations within the target; and    means for processing said concurrent information, wherein said means for processing said concurrent information enables non-invasive analysis of the target.    
     
     
         19 . The apparatus of  claim 18 , wherein the probe and reference beams are generated by at least one super-luminescent diode.  
     
     
         20 . The apparatus of  claim 18 , wherein the probe and reference beams are generated by at least one source of broadband radiation.  
     
     
         21 . The apparatus of  claim 18 , wherein the reference beam is separated into component reference beams by at least one beam-splitter.  
     
     
         22 . The apparatus of  claim 18 , wherein the reference beam is separated into component reference beams by a partially reflective element.  
     
     
         23 . The apparatus of  claim 18 , wherein the reference beam is separated into component reference beams by a MEMS based mirror array.  
     
     
         24 . The apparatus of  claim 18 , wherein at least one component reference beam is modulated by the motion of at least one micro-mirror of the MEMS based mirror array.  
     
     
         25 . The apparatus of  claim 18 , wherein at least one component reference beam is modulated by sequentially switching micro-mirrors at least some of which have a large physical separation.  
     
     
         26 . The apparatus of  claim 18 , wherein at least one component reference beam is modulated by the motion of the MEMS based mirror array.  
     
     
         27 . The apparatus of  claim 18 , wherein at least some of the different component reference beams are modulated in a manner that results in interferometric signals with different frequency content.  
     
     
         28 . The apparatus of  claim 18 , wherein at least some of the different component reference beams are modulated in a manner that results in interferometric signals that occur at different time intervals.  
     
     
         29 . The apparatus of  claim 18 , wherein the signals related to different component reference beams are separated by electronic processing of the detected composite electronic signal.  
     
     
         30 . The apparatus of  claim 18 , wherein the concurrent information from different locations within the target is processed to provide scattering information.  
     
     
         31 . The apparatus of  claim 30 , wherein the scattering information is analyzed to determine a measurement of an analyte.  
     
     
         32 . The apparatus of  claim 31 , wherein the measurement of an analyte is the concentration level of glucose in tissue.  
     
     
         33 . The apparatus of  claim 18 , wherein the concurrent information from different depth locations is analyzed to provide imaging information.