Linear array detector system and inspection method

Abstract

A linear array detector (LAD) for scanning an object is provided. The detector includes a scintillator layer configured for generating a number of optical signals representative of a fraction of an incident X-ray beam passing through the object. The plane of the scintillator is parallel to the X-ray beam. The LAD further includes a two dimensional array of photo-conversion elements configured to receive several X-rays of the X-ray beams and configured to generate corresponding electrical signals. An arrangement of the photo-conversion elements is independent of the X-ray paths.

1 . A linear array detector (LAD) for scanning an object, the detector comprising: 
 a scintillator layer configured for generating a plurality of optical signals representative of a fraction of an incident X-ray beam passing through the object, wherein the plane of the scintillator is parallel to the X-ray beam; and    a two dimensional array of photo-conversion elements configured to receive a plurality of X-rays of the X-ray beams and configured to generate a corresponding plurality of electrical signals; wherein an arrangement of the photo-conversion elements is independent of the plurality of X-ray paths.    
   
   
       2 . The LAD of  claim 1 , further comprising a light delivery means configured for transporting the optical signals to the two-dimensional array.  
   
   
       3 . The LAD of  claim 2 , wherein the light delivery means comprises a fiber optic plate.  
   
   
       4 . The LAD of  claim 2 , wherein the light delivery means comprises a fiber optic taper.  
   
   
       5 . The LAD of  claim 2 , wherein the light delivery means comprises an optical lens.  
   
   
       6 . The LAD of  claim 1 , wherein the photo-conversion elements are arranged in an orthogonal geometry with a plurality of rows and a plurality of columns.  
   
   
       7 . The LAD of  claim 1 , wherein the incident X-ray beam has an energy spectrum with an end point energy in a range of about 30 keV to about 16 MeV.  
   
   
       8 . The LAD of  claim 1 , wherein the two-dimensional array comprises at least one of an amorphous silicon flat panel or a charge coupled device array.  
   
   
       9 . The LAD of  claim 1 , wherein a thickness of the scintillator layer is in a range of about 50 microns to about 5 centimeters.  
   
   
       10 . The LAD of  claim 1 , wherein the LAD is configured to accommodate a photon count rate of up to about 100 GHz  
   
   
       11 . The LAD of  claim 1 , wherein the LAD is configured to scan with a plurality of geometries.  
   
   
       12 . The LAD of  claim 1 , wherein the LAD is adapted for use in an energy-integrating digital radiography system.  
   
   
       13 . The LAD of  claim 1 , wherein the LAD is adapted for use in an energy-integrating computed tomography system.  
   
   
       14 . The LAD of  claim 1 , wherein the photo-conversion elements comprise photodiodes.  
   
   
       15 . A system for scanning an object having an arbitrary geometry, the system comprising: 
 at least one detector configured for generating electrical signals representative of an incident X-ray beam passing through the object, wherein the detector comprises a scintillator and a two dimensional array of photo-conversion elements; and    a processor coupled to the detector and configured to: 
 determine an X-ray path geometry from the two dimensional array, wherein the X-ray path geometry comprises at least one X-ray path, and wherein the X-ray path passes through at least one of the photo-conversion elements,  
 determine an energy deposition profile for at least one segment of the X-ray paths, and  
 generate an image of the object based on the energy deposition profile and the X-ray paths.  
   
   
   
       16 . The system of  claim 15 , wherein the processor is configured to determine the X-ray path geometry based on imaging at least one fiducial.  
   
   
       17 . The system of  claim 16 , wherein the processor is further configured to bin the energy deposition profile into at least two segments of deposition.  
   
   
       18 . The system of  claim 17 , wherein the processor is further configured to determine a plurality of optimal segments of energy deposition for an application in a post-data acquisition fashion.  
   
   
       19 . The system of  claim 18 , wherein the processor is configured to perform a search to determine a dependence of at least one of an image quality and a material-specific detectability on the X-ray path geometry.  
   
   
       20 . The system of  claim 19 , wherein the application corresponds to an object size, an object type, and a source energy.  
   
   
       21 . The system of  claim 15 , wherein the system is used for non-destructive evaluation.  
   
   
       22 . The system of  claim 15 , wherein the system is an explosive detection system.  
   
   
       23 . The system of  claim 15 , wherein the system is a computed tomography system.  
   
   
       24 . The system of  claim 15 , wherein the system is a digital radiography system.  
   
   
       25 . An inspection method for inspecting an object, the method comprising; 
 impinging an incident X-ray beam on the object;    receiving the X-ray beam passing through the object with a detector, the detector comprises a scintillator and a two dimensional array of photo-conversion elements, wherein the scintillator is aligned parallel to the X-ray beam;    determining an X-ray path geometry from the two dimensional array, wherein the X-ray path geometry comprises at least one X-ray path;    determining an energy deposition profile for at least one segment of each of the at least one X-ray path; and    generating an image of the object using the at least one X-ray path and the energy deposition profile.    
   
   
       26 . The inspection method of  claim 22 , wherein determining the X-ray path geometry includes imaging at least one fiducial.  
   
   
       27 . The inspection method of  claim 22 , further comprising binning the energy deposition profile into at least two segments of deposition, wherein each of the segments of deposition corresponds to a respective x-ray energy level.  
   
   
       28 . The inspection method of  claim 24 , wherein the segments comprise contiguous segments of deposition  
   
   
       29 . The inspection method of  claim 24 , wherein the segments comprise non-contiguous segments of deposition.  
   
   
       30 . The inspection method of  claim 24 , wherein the energy deposition profile is binned into a first and a second segment of deposition, the first segment corresponding to low-energy X-rays and the second segment corresponding to high-energy X-rays.  
   
   
       31 . The inspection method of  claim 27 , further comprising processing the image using the energy deposition profile corresponding to the high-energy X-rays and to the low-energy X-rays to provide a material-specific detection capability.  
   
   
       32 . The inspection method of  claim 22 , wherein the method is adapted for use in non-destructive evaluation (NDE) of materials.  
   
   
       33 . The inspection method of  claim 29 , wherein the NDE of materials include evaluation of turbine airfoils and turbine blades.  
   
   
       34 . The inspection method of  claim 29 , wherein the NDE of materials include the determination of corrosion and inclusions.  
   
   
       35 . The inspection method of  claim 29 , wherein the NDE of materials include the detection of debris inside a pipe.  
   
   
       36 . The inspection method of  claim 32 , wherein the pipe is used for transporting water, gas, or oil.  
   
   
       37 . The inspection method of  claim 22 , wherein the method is adapted for use in baggage inspection systems.  
   
   
       38 . The inspection method of  claim 22 , wherein the method is adapted for use in cargo inspection systems.  
   
   
       39 . The inspection method of  claim 22 , wherein the method is adapted for use in digital radiography systems.  
   
   
       40 . The inspection method of  claim 22 , wherein the method is adapted for use in computed tomography systems.  
   
   
       41 . The inspection method of  claim 22 , wherein the method is adapted for use in explosives detection systems.