US2006073600A1PendingUtilityA1

Temperature control method for liquid components in analyzing instrument, the analyzing instrument and analyzing apparatus

Assignee: KITAMURA SHIGERUPriority: Oct 28, 2002Filed: Oct 24, 2003Published: Apr 6, 2006
Est. expiryOct 28, 2022(expired)· nominal 20-yr term from priority
B01L 3/502715G01N 27/44734Y10T436/115831B01L 7/00G01N 2035/00415
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Claims

Abstract

This invention relates to a technique for adjusting the temperature of a liquid held on an analyzing instrument ( 1 ) to a target value. The invention provides a temperature control method wherein thermal energy is supplied to liquid ( 10 ) by passing a magnetic flux across an analyzing instrument ( 1 ) for raising the temperature of the liquid. The invention also provides an analyzing instrument ( 1 ) and analyzing apparatus (X) which are suited to raising the temperature of a liquid ( 10 ) using a magnetic flux.

Claims

exact text as granted — not AI-modified
1 . A temperature control method for a liquid in an analyzing instrument which is a method for adjusting the liquid held on an analyzing instrument to a target temperature, 
 wherein thermal energy is supplied to the liquid by passing a magnetic flux across the analyzing instrument for raising the temperature of the liquid.    
     
     
         2 . A temperature control method according to  claim 1 , wherein the analyzing instrument includes a heating layer which heats up when a magnetic flux is passed across it, and 
 wherein the temperature of the liquid is raised using the thermal energy from the heating of the heating layer.    
     
     
         3 . A temperature control method according to  claim 2 , wherein the heating layer is formed as a thin metal film.  
     
     
         4 . A temperature control method according to  claim 3 , wherein the thin metal film is formed from aluminum, nickel or copper to have a thickness of 1-200 μm.  
     
     
         5 . A temperature control method according to  claim 1 , wherein the analyzing instrument has a reaction zone for reacting a sample and a reagent, the temperature is raised with respect to the liquid present in the reaction zone.  
     
     
         6 . A temperature control method according to  claim 1 , wherein the temperature of the liquid is controlled by monitoring the temperature of the liquid and using the monitoring results as feedback for repeatedly controlling a state of the magnetic flux passed across the analyzing instrument.  
     
     
         7 . A temperature control method according to  claim 1 , wherein the temperature of the liquid is controlled by first ascertaining relationship between an environmental temperature around the liquid and a state of the magnetic flux passed across the analyzing instrument necessary for raising the temperature of the liquid to the target temperature, determining an amount of control necessary to achieve the target passage state of the magnetic flux based on said relationship and the measured environmental temperature, and then controlling the passage state of the magnetic flux in the analyzing instrument according to the determined amount of control.  
     
     
         8 . A temperature control method according to  claim 1 , wherein the analyzing instrument comprises a microdevice used for analyzing a tiny amount of sample.  
     
     
         9 . An analyzing instrument used for analyzing a sample, comprising a heating layer which is heated by passage of a magnetic flux.  
     
     
         10 . An analyzing instrument according to  claim 9 , wherein the heating layer is formed as a thin metal film.  
     
     
         11 . An analyzing instrument according to  claim 10 , wherein the thin metal film is formed from aluminum, nickel or copper.  
     
     
         12 . An analyzing instrument according to  claim 11 , wherein the thin metal film has a thickness of 1-200 μm.  
     
     
         13 . An analyzing instrument according to  claim 9 , comprising a reaction zone for reacting a sample and a reagent, 
 wherein the heating layer is formed where it can supply thermal energy to the liquid present in the reaction zone.    
     
     
         14 . An analyzing instrument according to  claim 13 , wherein the heating layer covers a peripheral portion of the reaction zone.  
     
     
         15 . An analyzing instrument according to  claim 13 , wherein the heating layer covers the reaction zone.  
     
     
         16 . An analyzing instrument according to  claim 13 , wherein the heating layer is formed in the reaction zone.  
     
     
         17 . An analyzing instrument according to  claim 9 , which is a microdevice for analyzing a tiny amount of sample.  
     
     
         18 . A temperature detecting analyzing apparatus for analyzing a sample with use of a sample-holding analyzing instrument while adjusting a temperature of a liquid held on the analyzing instrument, the analyzing apparatus comprising a magnetic generating coil for generating a magnetic flux across the analyzing instrument.  
     
     
         19 . A temperature detecting analyzing apparatus according to  claim 18 , further comprising a temperature detector for measuring a temperature of the liquid or an environmental temperature around the liquid, and a controller for controlling a state of the magnetic flux generated by the magnetic generating coil based on the measurement results of the temperature detector.  
     
     
         20 . A temperature detecting analyzing apparatus according to  claim 19 , further comprising an AC voltage applier which causes the magnetic generating coil to generate a magnetic flux, wherein the controller controls the state of the magnetic flux generated by the magnetic generating coil by controlling the An AC voltage applier.

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