Ion optics for mass spectrometers

Abstract

Apparatus and methods are disclosed for aligning components of an ion optics system particularly as applied to mass spectroscopy apparatus. An apparatus comprises a base having a front face, a rear face and at least one side face, and at least two supports. Each of the supports has at least one face. Each of the supports is affixed to the base by alignment of a portion of at least one face of the base and a portion of at least one face of the support thereby resulting in the alignment of the supports relative to one another. At least one of the supports has attached thereto a component of an ion optics system for a mass spectrometer. In a mass spectroscopy apparatus the support mating faces and the base mating faces are configured and dimensioned such that, when the support mating faces are brought together in registration with the respective base mating faces, the components are optically aligned within acceptable tolerances. Also disclosed are apparatus for making electrical in high vacuum environments. An apparatus has at least one groove therein. An electrical lead is sequestered in the groove and the apparatus further comprises a shielding plate covering the groove.

1 - 30 . (canceled)  
     
     
         31 . A mounting base for a time of flight mass spectrometer, comprising: 
 a first registration element at a first pre-defined location of said mounting base;    a second registration element at a second pre-defined location of said mounting base; and    a third registration element at a third pre-defined location of said mounting base;    wherein said first, second and third registration elements are for mounting ion optic components onto said mounting base in each of said predefined locations.    
     
     
         32 . The mounting base of  claim 31 , wherein said mounting base further comprises an ion optic component mounted thereon.  
     
     
         33 . The mounting base of  claim 32 , wherein said ion optic component is mounted onto said mounting base via a support member.  
     
     
         34 . The mounting base of  claim 31 , wherein said ion optic component is directly mounted onto said mounting base.  
     
     
         35 . The mounting base of  claim 31 , wherein said first, second and third registration elements are for mounting ion source, a detector, a pulser, an ion mirror or an Einzel lens.  
     
     
         36 . The mounting base of  claim 31 , wherein said mounting base further comprises a pulser, an ion mirror and an Einzel lens mounted to said registration elements.  
     
     
         37 . The mounting base of  claim 31  wherein said mounting base provides for alignment of ion optic components mounted thereon to a predetermined specification.  
     
     
         38 . A mounting base for a time of flight mass spectrometer, wherein said mounting base provides for mutual alignment of ion optic components mounted thereon to a predetermined specification, without further adjustment of said ion optic components after they have been mounted onto said base.  
     
     
         39 . The mounting base of  claim 38 , wherein said ion optic mounting base comprises registration elements for mounting said ion optic components onto said ion optic mounting base.  
     
     
         40 . The mounting base of  claim 39 , wherein said registration elements are holes in said mounting base.  
     
     
         41 . The mounting base of  claim 38 , wherein said mutual alignment is to within 0.3 degrees.  
     
     
         42 . The mounting base of  claim 38 , wherein said mutual alignment is parallel alignment.  
     
     
         43 . The mounting base of  claim 38 , wherein said mutual alignment is perpendicular alignment.  
     
     
         44 . The mounting base of  claim 38 , wherein said mounting base comprises a support for mounting an ion optic component.  
     
     
         45 . The mounting base of  claim 38 , further comprising an ion optic component mounted thereon.  
     
     
         46 . The mounting base of  claim 38 , wherein said ion optic component is mounted onto said base via a support member.  
     
     
         47 . The ion-optic mounting base of  claim 38 , wherein said ion optic component is directly mounted onto said support.  
     
     
         48 . A time of flight mass spectrometer comprising: 
 a mounting base for a time of flight mass spectrometer, comprising: 
 a first registration element at a first pre-defined location of said mounting base;  
 a second registration element at a second pre-defined location of said mounting base; and  
 a third registration element at a third pre-defined location of said mounting base; and  
   a plurality of ion optics components mounted onto said registration elements in each of said predefined locations    
     
     
         49 . The mass spectrometer of  claim 48 , wherein said ion optic components are two or more of an ion source, a detector, a pulser, an ion mirror or an Einzel lens.  
     
     
         50 . A method for constructing a time of flight mass spectrometer comprising a plurality of components of an ion optic system, comprising: 
 securing said components of an ion optic system to an a mounting base comprising: 
 a first registration element at a first pre-defined location of said mounting base;  
 a second registration element at a second pre-defined location of said mounting base; and  
 a third registration element at a third pre-defined location of said mounting base;  
   to construct said time or flight mass spectrometer.    
     
     
         51 . The method of  claim 50 , wherein said components are two or more of an ion source, a detector, a pulser, an ion mirror or an Einzel lens.