In-process vision detection of flaws and fod by back field illumination

Abstract

A flaw and foreign object debris (FOD) detection system ( 11 ) for use during fabrication of a structure ( 12 ) includes an illumination device ( 13 ). The illumination device ( 13 ) is configured to be in proximity with a fabrication system ( 10 ) and illuminates a portion ( 18 ) of the structure ( 12 ). The illumination device ( 13 ) directs light rays ( 16 ) at acute angles relative to the portion ( 18 ). A detector ( 14 ) monitors the portion ( 18 ) and detects FOD in the portion ( 18 ) during fabrication of the structure ( 12 ) in response to the reflection of the light rays ( 16 ) off of the portion ( 18 ).

1 . A flaw and foreign object debris (FOD) detection system for use during fabrication of a structure comprising: 
 at least one illumination device configured to be in proximity with a fabrication system and illuminating a portion of the structure, said at least one illumination device directing light rays at said portion and at acute angles relative to said portion; and    at least one detector monitoring said portion and detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion.    
   
   
       2 . A system as in  claim 1  wherein said at least one detector detects at least one flaw and said FOD.  
   
   
       3 . A system as in  claim 2  wherein said at least one detector detects said at least one flaw and said FOD simultaneously.  
   
   
       4 . A system as in  claim 1  wherein said at least one illumination device directs said light rays at angles of approximately less than or equal to 15° relative to said portion.  
   
   
       5 . A system as in  claim 1  wherein said at least one detector detects contrast differences between said FOD and said portion.  
   
   
       6 . A system as in  claim 1  wherein said at least one illumination device generates said light rays at a single illumination level.  
   
   
       7 . A system as in  claim 1  wherein said at least one illumination device generates said light rays at a single illumination level to reveal at least one flaw and said FOD simultaneously.  
   
   
       8 . A system as in  claim 1  wherein said at least one illumination device comprises: 
 a first illumination device directing a first set of light arrays at said portion; and    a second illumination device directing a second set of light arrays at said portion.    
   
   
       9 . A system as in  claim 8  wherein said first set of light arrays and said second set of light arrays are at a single illumination level.  
   
   
       10 . A system as in  claim 1  wherein said at least one detector detects at least one flaw and said FOD simultaneously in response to said illumination of said portion at a single illumination level.  
   
   
       11 . A system as in  claim 1  wherein said at least one detector generates a status signal in response to said detection.  
   
   
       12 . A system as in  claim 11  further comprising an indicator indicating said status signal.  
   
   
       13 . A system as in  claim 12  wherein said indicator comprises a processor.  
   
   
       14 . A system as in  claim 1  wherein said at least one illumination device is selected from at least one of an incandescent light, a light emitting diode, a noble gas arc lamp, a metal arc lamp, a strobe, a fluorescent light, an infrared light, and a laser.  
   
   
       15 . A system as in  claim 1  wherein said at least one detector is selected from at least one of a camera, an infrared sensor, a visible light sensor, a visible light sensor with infrared-pass filtration, and a charged-coupled device.  
   
   
       16 . A fabrication system comprising: 
 a lamination system comprising a layer applicator applying a plurality of composite material layers to a substrate to form a structure; and    a flaw and foreign object debris (FOD) detection system proximate said lamination system comprising;    at least one illumination device illuminating a portion of the structure, said at least one illumination device directing light rays at said portion and at acute angles relative to said portion; and    at least one detector monitoring said portion and detecting FOD in said portion during application of said plurality of composite material layers in response to reflection of said light rays off of said portion.    
   
   
       17 . A fabrication system as in  claim 16  further comprising an indicator indicating detection of said FOD.  
   
   
       18 . A fabrication system as in  claim 17  wherein said indicator comprises a processor.  
   
   
       19 . A fabrication system as in  claim 16  wherein said lamination system adjusts operation of said lamination system in response to said detection.  
   
   
       20 . A fabrication system as in  claim 16  wherein said lamination system delays further application of said plurality of composite material layers in response to said detection for repair of said portion.  
   
   
       21 . A flaw and foreign object debris (FOD) detection system for use during fabrication of a structure comprising: 
 at least one illumination device illuminating a portion of the structure, said at least one illumination device directing light rays having a single illumination level at said portion and at acute angles relative to said portion; and    at least one detector monitoring said portion and detecting at least one flaw and FOD simultaneously in said portion during fabrication of the structure in response to reflection of said light rays off of said portion.    
   
   
       22 . A system as in  claim 21  wherein said at least one illumination device directs said light rays at angles of approximately greater than or equal to 2° and approximately less than or equal to 15° relative to said portion.  
   
   
       23 . A system as in  claim 21  wherein said at least one illumination device comprises: 
 a first illumination device directing a first set of light arrays at said portion; and    a second illumination device directing a second set of light arrays at said portion.    
   
   
       24 . A system as in  claim 23  wherein said first set of light arrays and said second set of light arrays are at a single illumination level.  
   
   
       25 . A system as in  claim 21  wherein said at least one detector detects said at least one flaw and said FOD simultaneously in response to said illumination of said portion at said single illumination level.  
   
   
       26 . A fabrication system comprising: 
 a lamination system comprising a layer applicator applying a plurality of composite material layers to a substrate to form a structure; and    a flaw and foreign object debris (FOD) system proximate said lamination system comprising;    at least one illumination device illuminating a portion of the structure, said at least one illumination device directing light rays having a single illumination level at said portion and at acute angles relative to said portion; and    at least one detector monitoring said portion and detecting at least one flaw and FOD simultaneously in said portion during application of said plurality of composite material layers in response to reflection of said light rays off of said portion.    
   
   
       27 . A fabrication system as in  claim 26  further comprising an indicator indicating said at least one flaw or said FOD.  
   
   
       28 . A fabrication system as in  claim 27  wherein said indicator comprises a processor.  
   
   
       29 . A fabrication system as in  claim 26  wherein said lamination system adjusts operation of said lamination system in response to said detection.  
   
   
       30 . A fabrication system as in  claim 26  wherein said lamination system delays further application of said plurality of composite material layers in response to said detection for repair of said portion.  
   
   
       31 . A method of detecting a flaw or a FOD in a structure during fabrication of that structure comprising: 
 generating light rays;    directing said light rays at a portion of the structure and at acute angles relative to said portion;    monitoring said portion; and    detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion.    
   
   
       32 . A method as in  claim 31  wherein generating said light rays comprises generating said lights rays at a single illumination level.  
   
   
       33 . A method as in  claim 31  wherein detecting said FOD comprises detecting light reflection characteristics of said FOD illuminated at a single illumination level.  
   
   
       34 . A method as in  claim 31  wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously.  
   
   
       35 . A method as in  claim 31  wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously in response to illumination of said portion at a single illumination level.  
   
   
       36 . A method of fabricating a structure comprising: 
 applying a plurality of composite material layers to a substrate to form a structure;    generating light rays;    directing said light rays at a portion of the structure and at acute angles relative to said portion;    monitoring said portion; and    detecting FOD in said portion during application of said plurality of composite material layers in response to reflection of said light rays off of said portion.    
   
   
       37 . A method as in  claim 36  wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously.  
   
   
       38 . A method as in  claim 36  wherein detecting said FOD comprises detecting at least one flaw and said FOD simultaneously in response to illumination of said portion at a single illumination level.  
   
   
       39 . A method as in  claim 36  adjusting operation of said lamination system in response to said detection.  
   
   
       40 . A method as in  claim 36  delaying further application of said plurality of composite material layers in response to said detection for repair of said portion.