US2006110525A1PendingUtilityA1
Nanotechnological processing to a copper oxide superconductor increasing critical transition temperature
Est. expiryNov 19, 2024(expired)· nominal 20-yr term from priority
Inventors:Robert Indech
C23C 16/45529C23C 16/408C23C 16/45531H10N 60/0604
42
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Claims
Abstract
A method for forming a superconductor material includes the steps of forming a substrate, placing the substrate in compressive stress, forming a hilly region on the substrate, and applying varying layering of copper, copper oxide, and selected interstitial atomic species.
Claims
exact text as granted — not AI-modified1 ) A method for forming a superconductor material, comprising the steps of:
forming a substrate; placing said substrate in compressive stress; forming a hilly region on said substrate.
2 ) A method for forming a superconductor material as in claim 1 wherein said hilly region includes a convex region and a concave region.
3 ) A method for forming a superconductor material as in claim 1 , wherein said method includes the step of forming copper-oxygen-copper bonds on said hilly region.
4 ) A method for forming a superconductor material as in claim 1 , wherein said method includes the step of applying tensile stress to said substrate.
5 ) A method for forming a superconductor material as in claim 1 , wherein said method includes the step of applying a copper-oxygen mix to said hilly region.
6 ) A method for forming a superconductor material as in claim 1 , wherein said method includes the step of forming a copper layer on said substrate before said compressive stress is applied.
7 ) A method for forming a superconductor material as in claim 5 , wherein said method includes the step of depositing a first interstitial atomic species upon said copper-oxide layer.
8 ) A method for forming a superconductor material as in claim 7 , wherein said method includes the step of depositing a second copper-oxide layer.
9 ) A method for forming a superconductor material as in claim 8 , wherein said method includes the step of depositing a second interstitial atomic species and a third copper-oxide layer upon said second copper-oxide layer.
10 ) A method for forming a superconductor material as in claim 1 , wherein said method includes the step of releasing compressive stress of said substrate.
11 ) An apparatus forming a superconductor material, comprising an atomic layer deposition apparatus to deposit a substrate; said atomic layer deposition apparatus applying compressive stress to said substrate; and
said atomic layer deposition apparatus forming a hilly region on said substrate.
12 ) An apparatus for forming a superconductor material as in claim 11 wherein said hilly region includes a convex region and a concave region.
13 ) An apparatus for forming a superconductor material as in claim 11 , wherein said atomic layer deposition apparatus forms copper-oxygen-copper bonds on said hilly region.
14 ) An apparatus for forming a superconductor material as in claim 11 , wherein said atomic layer deposition apparatus applies tensile stress to said substrate.
15 ) An apparatus for forming a superconductor material as in claim 11 , wherein said atomic layer deposition apparatus applies a copper-oxygen mix to said hilly region.
16 ) An apparatus for forming a superconductor material as in claim 11 , wherein said atomic layer deposition apparatus forms a copper layer on said substrate before said compressive stress is applied.
17 ) An apparatus for forming a superconductor material as in claim 11 , wherein said atomic layer deposition apparatus applies a vacuum purge followed by an argon purge.
18 ) An apparatus for forming a superconductor material as in claim 10 , wherein said atomic layer deposition apparatus applies multiple interstitial atomic layers and multiple copper oxide layers on said substrate.
19 ) An apparatus for forming a superconductor material as in claim 11 wherein said atomic layer deposition apparatus releases said compressive stress of said substrate.
20 ) An apparatus for forming a superconductor material as in claim 14 , wherein said atomic layer deposition apparatus releases said tensile stress of said substrate.Join the waitlist — get patent alerts
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