US2006118830A1PendingUtilityA1
MSD raised metal interface features
Est. expiryJan 29, 2024(expired)· nominal 20-yr term from priority
H05K 2201/09036H05K 2201/09563H05K 2201/09827H05K 2201/0394H05K 2203/0369H05K 2201/0367H05K 3/4007H05K 3/002H10W 72/251H10W 90/701H10W 70/688H10W 70/095H10W 70/093H10W 72/20H05K 3/40
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Claims
Abstract
Provided are partially etched dielectric films with raised conductive features. Also provided are methods for forming the raised conductive features in the dielectric films, which methods include partially etching the dielectric films.
Claims
exact text as granted — not AI-modified1 . An article for providing an electrical connection between at least a pair of electronic components, said article comprising:
a dielectric film having a first side, a second side and at least one metal-filled via, said dielectric film further having an etched film portion on at least said first side, said etched film portion including an etched surface adjacent to said metal filled via; and a conductive bump extending upward from said at least one metal-filled via at said first side of said dielectric film, said conductive bump providing electrical connection to one of said at least a pair of electronic components.
2 . The article of claim 1 wherein the conductive bump extends outwardly in x and y directions from said at least one metal-filled via to cover a portion of said etched surface.
3 . The article of claim 1 comprising an array of co-planar conductive bumps.
4 . The article of claim 3 wherein the array of co-planar conductive bumps are surrounded by the partially etched dielectric film thereby forming a non-conductive mask around the conductive bumps.Cited by (0)
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