US2006143887A1PendingUtilityA1
Forming a substrate core with embedded capacitor and structures formed thereby
Est. expiryDec 30, 2024(expired)· nominal 20-yr term from priority
Y10T29/49165Y10T29/49155Y10T29/43Y10T29/49147H05K 2201/09309H05K 2201/0179H05K 2201/0175H05K 3/4611H05K 1/162H01G 4/33H01G 4/10H01G 4/1209H05K 3/429
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Claims
Abstract
Methods of forming a microelectronic structure are described. Embodiments of those methods include forming a substrate core by attaching a first dielectric layer to a second conductive layer of a thin film capacitor, and attaching a second dielectric layer to a first conductive layer of the thin film capacitor.
Claims
exact text as granted — not AI-modified1 - 9 . (canceled)
10 . A method comprising:
forming a substrate core by:
attaching a first plurality of conductive pads disposed on a first thin film capacitor to a first side of a dielectric layer; and
attaching a second side of the dielectric layer to a second plurality of conductive pads disposed on a second thin film capacitor.
11 . The method of claim 10 wherein the first thin film capacitor comprises a capacitor dielectric layer disposed between the first plurality of conductive pads and a first conductive layer.
12 . The method of claim 11 wherein the capacitor dielectric layer comprises a dielectric constant greater then about 8.
13 . The method of claim 10 wherein the dielectric layer comprises a prepreg layer disposed on a core material, wherein the core material comprises a first plurality of core pads disposed on a first side of the core material, and a second plurality of core pads disposed on a second side of the core material.
14 . The method of claim 10 further comprising forming at least one opening through the substrate core.
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