US2006192101A1PendingUtilityA1

Probing method using ion trap mass spectrometer and probing device

Assignee: TAKADA YASUAKIPriority: Sep 20, 2000Filed: May 1, 2006Published: Aug 31, 2006

Est. expirySep 20, 2020(expired)· nominal 20-yr term from priority

Inventors:Yasuaki Takada Minoru Sakairi

H01J 49/004G01N 33/0057H01J 49/424H01J 49/0031

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Claims

Abstract

An analyzing method which includes ionizing a sample, dissociating plurality of precursor ions which have different m/z values, and deciding if fragment ions of a predetermined m/z value are present.

Claims

exact text as granted — not AI-modified

1 . A method for analyzing, comprising the steps of: 
 ionizing a sample;    dissociating plurality of precursor ions which have different m/z values; and    deciding if fragment ions of a predetermined m/z value are present.    
   
   
       2 . The method for analyzing according to  claim 1 , further comprising the step of selecting ions from the fragment ions of the predetermined m/z value, dissociating the selected fragment ions, and analyzing the dissociated ions.

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