US2006250906A1PendingUtilityA1
Method and system for correlating and combining production and non-production data for analysis
Est. expiryFeb 25, 2024(expired)· nominal 20-yr term from priority
G06Q 10/06
53
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
This document discusses, among other things, a method and system for correlating and combining production and non-production data for analysis for the purposes of increasing manufacturing efficiency and reducing manufacturing downtime due to abnormal conditions. In one example, this method provides for quicker data analysis which may result in less manufacturing product being discarded due to lengthy delays between abnormal conditions and the response to those conditions. In one example, a computer system is used to implement the method with the data captured from production and non-production sources being stored remotely on a server. In one example, a computer system is used to implement the method with the analyzed data being stored remotely on a server and accessed over a network for local examination.
Claims
exact text as granted — not AI-modified1 . A computer system, comprising:
a processor; at least one input device; at least one output device; at least one communications interface device; a storage device containing instructions for performing a method, the method comprising:
collecting production data;
collecting non-production data;
performing calculations on the production data;
performing calculations on the non-production data;
keying production data;
keying non-production data;
combining the production data and the non-production data into a single data set;
analyzing said data set; and
examining the analysis of the data; and
a bus connecting the processor, input device, output device and storage device.
2 . The computer system of claim 1 , wherein collecting production data includes collecting production data from a test probe.
3 . The computer system of claim 1 , wherein collecting production data includes collecting parametric production data.
4 . The computer system of claim 1 , wherein collecting production data includes collecting data on film thickness.
5 . The computer system of claim 1 , wherein collecting production data includes collecting data on critical dimensions.
6 . The computer system of claim 1 , wherein collecting production data includes any other data that is relevant to the production process and its condition.
7 . The computer system of claim 1 , wherein collecting non-production data includes collecting non-production data from a single data source at a single source location.
8 . The computer system of claim 1 , wherein collecting non-production data includes collecting non-production data from a single data source from a plurality of locations.
9 . A computer system, comprising:
a processor; at least one input device; at least one output device; at least one communications interface device; a storage device containing instructions for performing a method, the method comprising:
collecting production data;
collecting non-production data from a single data source with some temporal periodicity;
performing calculations on the production data;
performing calculations on the non-production data;
keying the production data;
keying the non-production data;
combining the production data and the non-production data into a single data set;
analyzing the single data set; and
examining the analysis of the data; and
a bus connecting the processor, input device, output device, communications interface device and storage device.
10 . The computer system of claim 9 , wherein the temporal periodicity is fixed.
11 . The computer system of claim 9 , wherein the temporal periodicity is not fixed.
12 . The computer system of claim 9 , wherein collecting non-production data includes collecting atmospheric data.
13 . The computer system of claim 9 , wherein collecting non-production data includes collecting facility related quality data.
14 . The computer system of claim 9 , wherein collecting non-production data includes collecting equipment control data.
15 . The computer system of claim 9 , wherein collecting non-production data includes collecting metrology tool calibration data.
16 . The computer system of claim 9 , wherein collecting non-production data includes collecting any other data relevant to the production environment.
17 . A computer system, comprising:
a processor; at least one input device; at least one output device; at least one communications interface device; a storage device containing instructions for performing a method, the method comprising:
collecting production data;
collecting non-production data;
performing calculations on the production data;
performing weighted mean calculations on the non-production data;
keying the production data;
keying the non-production data;
combining the production data and the non-production data into a single data set;
analyzing the single data set; and
examining the analysis of the data; and
a bus connecting the processor, input device, output device, communications interface device and storage device.
18 . The computer system of claim 17 , wherein the weighted mean calculation is weighted first by location where the data sources are from a plurality of locations, given by the following equation:
V
=
∑
n
=
1
i
[
ⅆ
i
∑
n
=
1
i
ⅆ
i
]
S
i
where, V is the calculated data point, d i is the distance between the sampling point and the process location and S i is the data being measured at the sampling point.
19 . The computer system of claim 18 , wherein the data is further calculated by performing a weighted mean calculation by time, given by the equation:
V
=
(
1
tS
x
-
1
-
tS
x
)
[
S
x
(
tS
x
+
1
-
tL
v
)
+
S
x
+
1
(
tL
v
-
tS
x
)
]
where V is the calculated lot data to be keyed to the production lot data, tS x is the time of the most recent facility data sampling, tS X+1 is the time of the next consecutive facility data sampling, and tL v is the time of processing the production lot.
20 . The computer system of claim 17 , wherein the weighted mean calculation is weighted by time, given by the equation:
V
=
(
1
tS
x
-
1
-
tS
x
)
[
S
x
(
tS
x
+
1
-
tL
v
)
+
S
x
+
1
(
tL
v
-
tS
x
)
]
where V is the calculated lot data to be keyed to the production lot data, tS x is the time of the most recent facility data sampling, tS X+1 is the time of the next consecutive facility data sampling, and tL v is the time of processing the production lot.
21 . The computer system of claim 17 , wherein keying the production data includes adding the calculated non-production data to the appropriate production data.
22 . The computer system of claim 21 , wherein the appropriate production data is data from production lots that were processed during the collection of relevant non-production data.
23 . A computer system, comprising:
a processor; at least one input device; at least one output device; at least one communications interface device; a storage device containing instructions for performing a method, the method comprising:
collecting production data;
collecting non-production data;
performing calculations on the production data;
performing weighted mean calculations on the non-production data;
keying the production data;
keying the non-production data;
identifying points of data commonality between the production and non-production data set;
defining relationships based on the identified commonalities;
combining the production data and the non-production data based on the defined relationships into a single data-set;
analyzing the single data-set; and
examining the analysis of the data; and
a bus connecting the processor, input device, output device, communications interface device and storage device.
24 . The computer system of claim 23 , wherein analyzing said single data set includes performing a trend analysis.
25 . The computer system of claim 23 , wherein analyzing said single data set includes statistical analysis.
26 . The computer system of claim 23 , wherein examining analysis of the data includes comparing the analysis of the collected data to some baseline analysis and identifying areas where trends are out of specifications.
27 . The computer system of claim 23 , wherein examining analysis of the data includes comparing the analysis of the collected data to some baseline analysis and identifying areas where readings are out of specifications.
28 . The computer system of claim 23 , wherein examining analysis of the data includes comparing the analysis of the collected data to some baseline analysis and identifying areas where trends and readings are out of specifications.
29 . A computer system, comprising:
a processor; at least one input device; at least one output device; at least one communications interface device; a storage device containing instructions for performing a method, the method comprising:
collecting production data;
collecting non-production data;
performing calculations on the production data;
performing weighted mean calculations on the non-production data;
keying the production data;
keying the non-production data;
identifying points of data commonality between the production and non-production data set;
defining relationships based on the identified commonalities;
combining the production data and the non-production data based on the defined relationships into a single data-set;
analyzing a single data-set stored remotely on a server; and
examining the analysis of the data; and
a bus connecting the processor, input device, output device, communications interface device and storage device.
30 . The computer system of claim 29 , wherein analyzing said single data set includes performing a trend analysis.
31 . The computer system of claim 29 , wherein analyzing said single data set includes statistical analysis.
32 . The computer system of claim 29 , wherein examining analysis of the data includes comparing the analysis of the collected data to some baseline analysis and identifying areas where trends are out of specifications.
33 . The computer system of claim 29 , wherein examining analysis of the data includes comparing the analysis of the collected data to some baseline analysis and identifying areas where readings are out of specifications.
34 . The computer system of claim 29 , wherein examining analysis of the data includes comparing the analysis of the collected data to some baseline analysis and identifying areas where trends and readings are out of specifications.
35 . A computer system, comprising:
a processor; at least one input device; at least one output device; at least one communications interface device; a storage device containing instructions for performing a method, the method comprising:
collecting production data;
collecting non-production data;
performing calculations on the production data;
performing calculations on the non-production data;
keying production data;
keying non-production data;
combining the production data and the non-production data into a single data set;
analyzing said data set;
examining the analysis of the data; and
responding to the examination of the analysis; and
a bus connecting the processor, input device, output device, communications interface device and storage device.
36 . The computer system of claim 35 , wherein the responding includes an alert message displayed on the output device when the examination detects a trend in the data that is outside of expected results.
37 . The computer system of claim 35 , wherein the responding includes an alert message displayed on the output device when the examination detects a data reading that is outside of expected results.
38 . The computer system of claim 35 , wherein the responding includes an alert message displayed on the output device when the examination detects a trend in the data and a reading in the data that is outside of expected results.
39 . The computer system of claim 35 , wherein the responding includes non-manually halting the manufacturing process when the examination detects a trend in the data that is outside of expected results.
40 . The computer system of claim 35 , wherein the responding includes non-manually halting the manufacturing process when the examination detects a reading in the data that is outside of expected results.
41 . The computer system of claim 35 , wherein the responding includes non-manually halting the manufacturing process when the examination detects a trend in the data and a reading in the data that is outside of expected results.
42 . A method of responding to out of specification conditions in electronic device manufacturing, comprising:
collecting production data from at least one of a plurality of data sources; collecting non-production data from the of plurality of data sources separated by some non-fixed distance from a manufacturing process; performing calculations on the production data; performing weighted mean calculations on the non-production data, weighted by time, distance or distance/time; keying production data by adding the of a plurality of calculated production data to the production data from the production lots that were processed during the collection of the non-production data; combining the production data and the non-production data into a single data set; analyzing said data set; and examining the analysis of the data. combining the production data and the non-production data based on the defined relationships into a single data-set; analyzing the single data-set by trend or statistical analysis; examining the analysis of the data for the occurrence of readings or trends that are out of specifications; and responding to the examination of the analysis.
43 . The method of claim 42 , wherein responding to the examination of the analysis includes stopping the manufacturing process where the examination detects out of specification readings or trends.
44 . The method of claim 42 , wherein responding to the examination of the analysis includes continuing production where the examination detects no out of specification readings or trends.
45 . The method of claim 42 , wherein the analyzing the single data-set includes analyzing a single data set remotely stored on a serverJoin the waitlist — get patent alerts
Track US2006250906A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.