Modular gantry system for x-ray inspection

Abstract

A system for inspecting an enclosure. A source generates a beam of penetrating radiation that is characterized, at each instant of time, by a power spectrum of intensity as a function of energy. A first module conveys the source along the length of the enclosure while a detector, coupled so as to move in coordination with the first module, detects the beam of penetrating radiation after the beam interacts with the object and generating a detector signal. A beam shaper modifies the instantaneous power spectrum of the beam of penetrating radiation. The first module and the detector may be coupled by a gantry straddling the enclosure. Other modules may be coupled to move with the first module.

1 . An inspection system for inspecting an enclosure containing an object, the enclosure characterized by a length, the system comprising: 
 a. At least one source for generating a beam of penetrating radiation, the beam characterized, at each instant of time, by a power spectrum of intensity as a function of energy, the power spectrum referred to as the instantaneous power spectrum corresponding to that instant of time;    b. a first module for conveying at least one of the one or more sources along the length of the enclosure;    c. a first detector for detecting the beam of penetrating radiation after the beam interacts with the object and generating a detector signal, the detector coupled such that the detector moves in coordination with the first module,    d. a second detector for detection of any radiation scattered by the object; and    e. a beam shaper for modifying the instantaneous power spectrum of the beam of penetrating radiation.    
   
   
       2 . The inspection system of  claim 1 , further comprising a second module coupled for motion in coordination with the first module, the second module including an operator's console.  
   
   
       3 . The inspection system of  claim 1 , wherein the first detector includes a scatter detector.  
   
   
       4 . The inspection system of  claim 1 , wherein the second detector is coupled so as to move in coordination with the first module.  
   
   
       5 . The inspection system of  claim 1 , further comprising a gantry for coupling the first detector to the first module.