Systems and methods for analyzing data of a SAS/SATA device

Abstract

Systems and methods for analyzing data passing between an SAS/SATA device and a plurality of other devices are presented. A system includes a plurality of physical interfaces configured for passing data between the SAS/SATA device and the other devices. The system also includes a test interface, or test PHY, configured for coupling to the physical interfaces for analysis of the data passing through those physical interfaces. The test PHY may be integrally configured with the SAS/SATA device and may substantially minimize alteration of characteristic impedance caused by external analysis of the data. The system may also include a multiplexer for selectively coupling the PHYs to the test PHY.

1 . A serial communication device implemented as an integrated circuit, comprising: 
 a plurality of physical interfaces within the integrated circuit and each configured for passing application related data between the serial communication device and a corresponding device coupled thereto; and    a test interface within the integrated circuit integrated with the plurality of physical interfaces within the integrated circuit, the test interface configured for coupling the physical interfaces to the serial communication device to thereby enable analysis of the application related data passing through the physical interfaces to and/or from the corresponding device during normal operation of the serial communication device.    
     
     
         2 . The device of  claim 1 , wherein the test interface substantially minimizes alteration of characteristic impedance of the physical interfaces.  
     
     
         3 . The device of  claim 1 , further comprising a multiplexer communicatively connected between the physical interfaces and the test interface and the multiplexer configured for selectively coupling one or more of the physical interfaces to the test interface for data analysis of selected physical interfaces.  
     
     
         4 . The device of  claim 3 , further comprising a register communicatively coupled to the multiplexer and the register having addresses configured for assisting the multiplexer in selection of the data for analysis, wherein each address corresponds to an individual physical interface.  
     
     
         5 . A method of analyzing application related data passing between a plurality of devices and a serial communication device that comprises an integrated circuit, comprising: 
 selecting one or more interfaces from a plurality of physical interfaces of the serial communication device; and    coupling the one or more selected interfaces to a test interface of the serial communication device to permit analysis of application related data exchanged through the one or more selected interface during normal operation of the serial communication device,    wherein the plurality of physical interfaces and the test interface and the coupling therebetween are all internal to the integrated circuit that comprises the serial communication device.    
     
     
         6 . The method of  claim 5 , wherein the step of selecting comprises a step of accessing a register of the serial communication device to select one or more of the physical interfaces.  
     
     
         7 . The method of  claim 6 , wherein the step of accessing comprises a step of corresponding an address stored with the register to one of said physical interfaces.  
     
     
         8 . The method of  claim 5 , wherein the step of coupling comprises a step of passing the application related data of said physical interfaces to the test interface while the application related data continues passing between the plurality of devices and the serial communication device, wherein the test interface substantially minimizes impedance to the passing of application related data.  
     
     
         9 . The method of  claim 5 , further comprising a step of coupling the test interface to an analysis unit to analyze the application related data, wherein the test interface is substantially integrated with the serial communication device.  
     
     
         10 . The method of  claim 5 , further comprising a step of selectively coupling one or more channels of one or more of said physical interfaces to the test interface.  
     
     
         11 . A serial communication system for analyzing application related data passing between a serial communication device that comprises an integrated circuit and a plurality of devices coupled thereto, comprising: 
 a plurality of physical interfaces substantially integrated within the integrated circuit that comprises the serial communication device and configured for passing application related data between the serial communication device and the plurality of devices;    an analysis unit configured for analyzing the application related data passing through the physical interfaces during normal operation of the serial communication device;    a test interface substantially integrated within the integrated circuit that comprises the serial communication device and configured for passing the application related data to the analysis unit, wherein the test interface substantially minimizes alteration of characteristic impedance of the physical interfaces; and    a multiplexer substantially integrated within the integrated circuit that comprises the serial communication device and communicatively connected between the physical interfaces and the test interface and configured for selectively coupling within the serial communication device one or more of the physical interfaces to the test interface.    
     
     
         12 . The system of  claim 11 , further comprising a register substantially integrated with the serial communication device and configured for corresponding addresses to the physical interfaces such that the multiplexer selectively couples one or more of the physical interfaces to the test interface.  
     
     
         13 . The system of  claim 11 , wherein the multiplexer is adapted to selectively couple one or more channels of each physical interface to the test interface.