US2007020645A1PendingUtilityA1
Method of analysis of samples by determination of a function of specific brightness
Est. expiryOct 12, 2016(expired)· nominal 20-yr term from priority
Inventors:Peet Kask
G01N 15/02G01N 15/0205G01N 2015/0222
53
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Claims
Abstract
A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function of the number of photon counts.
Claims
exact text as granted — not AI-modified1 . A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function of the number of photon counts.
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