Method and apparatus for generating a telemetric impulsional response fingerprint for a computer system

Abstract

One embodiment of the present invention provides a system for generating telemetric impulsional response fingerprints for an electronic system. The system operates by first determining a steady-state response of the electronic system under specified initial conditions. Next, the system introduces a sudden impulse step change to a parameter of the electronic system and then measures the dynamic response of the electronic system to the sudden impulse step change. The system then generates a multiparametric representation from the steady-state response and the dynamic response wherein the multiparametric representation simultaneously displays the steady-state response and the dynamic response.

1 . A method for generating telemetric impulsional response fingerprints for an electronic system, comprising: 
 determining a steady-state response of the electronic system under specified initial conditions;    introducing a sudden impulse step change to a parameter of the electronic system;    measuring a dynamic response of the electronic system to the sudden impulse step change; and    generating a multiparametric representation, which simultaneously displays the steady state response and the dynamic response.    
     
     
         2 . The method of  claim 1 , wherein determining the steady-state response of the electronic system involves making measurements through a continuous system telemetry harness.  
     
     
         3 . The method of  claim 1 , wherein determining of the steady-state response of the electronic system involves monitoring at least one of temperature, voltage, current, and vibration at multiple points within the electronic system.  
     
     
         4 . The method of  claim 1 , wherein introducing the sudden impulse step change involves changing at least one of a load, a temperature, a voltage, and a vibration within the electronic system.  
     
     
         5 . The method of  claim 1 , wherein measuring the dynamic response of the electronic system involves normalizing the dynamic response for measured system parameters.  
     
     
         6 . The method of  claim 1 , wherein generating a multiparametric response representation involves creating a Kiviat diagram, which displays both the steady state response and the dynamic response.  
     
     
         7 . The method of  claim 1 , further comprising detecting incipient problems in the electronic system by comparing the multiparametric representation with a standard multiparametric representation derived from a known good electronic system.  
     
     
         8 . A computer-readable storage medium storing instructions that when executed by a computer cause the computer to perform a method for generating telemetric impulsional response fingerprints for an electronic system, the method comprising: 
 determining a steady-state response of the electronic system under specified initial conditions;    introducing a sudden impulse step change to a parameter of the electronic system;    measuring a dynamic response of the electronic system to the sudden impulse step change; and    generating a multiparametric representation, which simultaneously displays the steady state response and the dynamic response.    
     
     
         9 . The computer-readable storage medium of  claim 8 , wherein determining the steady-state response of the electronic system involves making measurements through a continuous system telemetry harness.  
     
     
         10 . The computer-readable storage medium of  claim 8 , wherein determining f the steady-state response of the electronic system involves monitoring at least one of temperature, voltage, current, and vibration at multiple points within the electronic system.  
     
     
         11 . The computer-readable storage medium of  claim 8 , wherein introducing the sudden impulse step change involves changing at least one of a load, a temperature, a voltage, and a vibration within the electronic system.  
     
     
         12 . The computer-readable storage medium of  claim 8 , wherein measuring the dynamic response of the electronic system involves normalizing the dynamic response for measured system parameters.  
     
     
         13 . The computer-readable storage medium of  claim 8 , wherein generating a multiparametric response representation involves creating a Kiviat diagram, which displays both the steady state response and the dynamic response.  
     
     
         14 . The computer-readable storage medium of  claim 8 , the method further comprising detecting incipient problems in the electronic system by comparing the multiparametric representation with a standard multiparametric representation derived from a known good electronic system.  
     
     
         15 . An apparatus for generating telemetric impulsional response fingerprints for an electronic system, comprising: 
 a determining mechanism configured to determine a steady-state response of the electronic system under specified initial conditions;    a step-change mechanism configured to introduce a sudden impulse step change to a parameter of the electronic system;    a measuring mechanism configured to measure a dynamic response of the electronic system to the sudden impulse step change; and    a generating mechanism configured to generate a multiparametric representation, which simultaneously displays the steady state response and the dynamic response.    
     
     
         16 . The apparatus of  claim 15 , wherein determining the steady-state response of the electronic system involves making measurements through a continuous system telemetry harness.  
     
     
         17 . The apparatus of  claim 15 , wherein determining the steady-state response of the electronic system involves monitoring at least one of temperature, voltage, current, and vibration at multiple points within the electronic system.  
     
     
         18 . The apparatus of  claim 15 , wherein introducing the sudden impulse step change involves changing at least one of a load, a temperature, a voltage, and a vibration within the electronic system.  
     
     
         19 . The apparatus of  claim 15 , wherein measuring the dynamic response of the electronic system involves normalizing the dynamic response for measured system parameters.  
     
     
         20 . The apparatus of  claim 15 , wherein generating a multiparametric response representation involves creating a Kiviat diagram, which displays both the steady state response and the dynamic response.