US2007039246A1PendingUtilityA1

Method for preparing polishing slurry

Assignee: LIU ZHENDONGPriority: Aug 17, 2005Filed: Jul 26, 2006Published: Feb 22, 2007
Est. expiryAug 17, 2025(expired)· nominal 20-yr term from priority
Inventors:Zhendong Liu
C09G 1/02
48
PatentIndex Score
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Cited by
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Claims

Abstract

The method for manufacturing polishing slurries is useful for polishing electronic substrates. The method includes preparing an aqueous intermediate dispersion, the aqueous intermediate dispersion containing solid particles; and introducing an azole compound into the aqueous intermediate dispersion to prevent biological activity and to form a stable intermediate dispersion. Then storing the stable intermediate dispersion; and introducing additional components to the stable intermediate dispersion to form a final polishing slurry.

Claims

exact text as granted — not AI-modified
1 . A method for manufacturing polishing slurries useful for polishing patterned integrated circuit substrates comprising the steps of: 
 preparing an aqueous intermediate dispersion, the aqueous intermediate dispersion containing solid particles and having an acidic pH;    introducing an azole compound into the aqueous intermediate dispersion to prevent biological activity and to form a stable intermediate dispersion;    storing the stable intermediate dispersion for at least one day; and    introducing additional components to the stable intermediate dispersion to form a final polishing slurry, the final polishing slurry having an acidic pH.    
   
   
       2 . The method of  claim 1  wherein the azole compound is selected from at least one of the group of 1,2,4-triazole, 3-methyl-1,2,4-triazole, 3,5-dimethyl-1,2,4-triazole, 1-amino-1,2,4-triazole, 3-amino-1,2,4-triazole, 5-amino-3-methyl-1,2,4-triazole, 3-isopropyl-1,2,4-triazole, 1,2,3-triazole, 1-methyl-1,2,3-triazole, 1-amino-1,2,3-triazole, 1-amino-5-methyl-1,2,3-triazole, 4,5-dimethyl-1,2,3-triazole, 1-amino-5-n-propyl-1,2,3-triazole, 1-(β-aminoethyl)-1,2,3-triazole, 1-methyltetrazole, 2-methyltetrazole, 5-amino-1H-tetrazole, 5-amino-1-methyltetrazole, 1-(β-aminoethyl)tetrazole, a substituted triazole and tetrazole compound having an electron-donating substituent.  
   
   
       3 . The method of  claim 1  including the step of adding additional azole compound with the additional components to maintain concentration of the azole compound above a level that prevents biological activity.  
   
   
       4 . The method of  claim 1  including the additional step of adding an oxidizer to the final polishing slurry.  
   
   
       5 . A method for manufacturing polishing slurries useful for polishing patterned integrated substrates, the patterned dielectric substrates having nonferrous interconnects, comprising the steps of: 
 preparing an aqueous intermediate dispersion, the aqueous intermediate dispersion containing solid particles and having a pH less than 5;    introducing at least 0.1 weight percent benzotriazole into the aqueous intermediate dispersion to prevent biological activity and to form a stable intermediate dispersion;    storing the stable intermediate dispersion at least one week; and    introducing additional components to the stable intermediate dispersion to form a final polishing slurry, the final polishing slurry having a pH less than 5.    
   
   
       6 . The method of  claim 5  including the step of adding additional benzotriazole with the additional components to maintain concentration of the benzotriazole above at least 0.2 weight percent to prevent biological activity.  
   
   
       7 . The method of  claim 5  including the additional step of adding an oxidizer to the final polishing slurry.  
   
   
       8 . The method of  claim 5  wherein the nonferrous interconnects are copper and including the additional step of polishing the patterned wafer.  
   
   
       9 . The method of  claim 8  wherein the benzotriazole decreases removal rate of the copper nonferrous interconnects.  
   
   
       10 . The method of  claim 5  wherein the pH is less than 5 and the solid particles include silica.

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