US2007087550A1PendingUtilityA1
Low-voltage single-layer polysilicon eeprom memory cell
Est. expiryMay 18, 2024(expired)· nominal 20-yr term from priority
H10D 30/681H10D 30/0411G11C 16/0433H10B 41/60H10B 41/30H10B 69/00
45
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Claims
Abstract
The present invention is an electronic memory cell and a method for the cell's fabrication comprising a The first transistor configured to be coupled to a bit line. The first transistor has an essentially zero voltage drop when activated and is configured to control an operation of the memory cell. A second transistor is configured to operate as a memory transistor and is coupled to the first transistor. The second transistor is further configured to be programmable with a voltage about equal to a voltage on the bit line.
Claims
exact text as granted — not AI-modified1 . A method for writing to an electronic programmable memory cell, comprising: applying about 10 volts to a source of a select transistor; applying 0 volts to a gate of the select transistor; applying 0 volts to a gate of a memory transistor; and allowing a source terminal of a memory transistor to float.
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