Nanocomposite photosensitive composition and use thereof
Abstract
The present invention relates to a photoresist composition suitable for image-wise exposure and development as a negative photoresist comprising a negative photoresist composition and an inorganic particle material having an average particle size equal or greater than 10 nanometers, wherein the thickness of the photoresist coating film is greater than 5 microns. The negative photoresist composition is selected from (1) a composition comprising (i) a resin binder, (ii) a photoacid generator, and (iii) a cross-linking agent; or (2) a composition comprising (i) a resin binder, (ii) optionally, addition-polymerizable, ethylenically unsaturated compound(s) and (iii) a photoinitiator; or (3) a composition comprising (i) a photopolymerizable compound containing at least two pendant unsaturated groups; (ii) ethylenically unsaturated photopolymerizable polyalkylene oxide hydrophilic compound(s); and (iii) a photoinitiator
Claims
exact text as granted — not AI-modified1 . A process of forming a negative photoresist image on a substrate, comprising the steps of:
(a) coating a photoresist composition comprising a negative photoresist composition and an inorganic particle material having an average particle size equal or greater than 10 nanometers on a substrate; (b) image-wise exposing the coated substrate to actinic radiation; and (c) developing the exposed substrate to form the photoresist image, thereby forming a photoresist coating film with a thickness greater than 5 microns.
2 . The process of claim 1 wherein for (a), the negative photoresist composition is selected from
(1) a composition comprising (i) a resin binder, (ii) a photoacid generator, and (iii) a cross-linking agent; or (2) a composition comprising (i) a resin binder, (ii) optionally, addition-polymerizable, ethylenically unsaturated compound(s) and (iii) a photoinitiator; or (3) a composition comprising (i) a photopolymerizable compound containing at least two pendant unsaturated groups; (ii) ethylenically unsaturated photopolymerizable polyalkylene oxide hydrophilic compound(s); and (iii) a photoinitiator.
3 . The process of claim 1 where the photoresist coating film thickness is greater than 10 microns.
4 . The process of claim 1 , where the photoresist coating film thickness is greater than 20 microns.
5 . The process of claim 1 , where the photoresist coating film thickness is less than 150 microns.
6 . The process of claim 1 , wherein for (a), the inorganic particle material is colloidal silica.
7 . The process of claim 1 , wherein for (a), the inorganic particle material has an average particle size from greater than about 10 to about 50 nanometers.
8 . The process of claim 1 , wherein for (a), the inorganic particle material is present in an amount of from about 0.1% and about 90% by weight of the photoresist.
9 . A substrate having formed thereon a photoresist coating film having a film thickness greater than 5 microns after exposure and development, the photoresist coating film formed from a composition comprising a negative photoresist composition and an inorganic particle material having an average particle size equal or greater than 10 nanometers.
10 . The substrate of claim 9 , wherein the film thickness is greater than 10 microns.
11 . The substrate of claim 9 , wherein the inorganic particle material is colloidal silica having an average particle size from greater than about 10 to about 50 nanometers.
12 . The substrate of claim 9 , wherein the inorganic particle material is present in an amount of from about 0.1% and about 90% by weight of the photoresist.
13 . A method of making photoresist composition suitable for image-wise exposure and development wherein the photoresist composition is capable of forming a photoresist coating film with a thickness greater than 5 microns after exposure and development comprising dispersing an inorganic particle material having an average particle size equal or greater than 10 nanometers in propylene glycol mono-methyl ether; and adding the dispersed inorganic particle material to a negative photoresist composition.
14 . The method of claim 13 , wherein the film thickness is greater than 10 microns.
14 . The method of claim 13 , wherein the inorganic particle material is colloidal silica having an average particle size from greater than about 10 to about 50 nanometers.
15 . The method of claim 13 , wherein the inorganic particle material is present in an amount of from about 0.1% and about 90% by weight of the photoresist.
16 . The method of claim 13 wherein the negative photoresist composition is selected from
(1) a composition comprising (i) a resin binder, (ii) a photoacid generator, and (iii) a cross-linking agent; or (2) a composition comprising (i) a resin binder, (ii) optionally, addition-polymerizable, ethylenically unsaturated compound(s) and (iii) a photoinitiator; or (3) a composition comprising (i) a photopolymerizable compound containing at least two pendant unsaturated groups; (ii) ethylenically unsaturated photopolymerizable polyalkylene oxide hydrophilic compound(s); and (iii) a photoinitiator.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.