Microscope examination apparatus

Abstract

The invention provides a microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.

1 . A microscope examination apparatus comprising: 
 a light source;    an illumination optical system configured to guide light from the light source to a specimen;    an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens;    an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens;    an optical detector configured to detect the return light imaged by the image-forming lens;    a microscope main body including the image-forming lens and the optical detector; and    an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.    
   
   
       2 . A microscope examination apparatus according to  claim 1 , wherein the objective lens is provided so as to be capable of parallel motion in a direction intersecting the optical axis thereof.  
   
   
       3 . A microscope examination apparatus according to  claim 2 , wherein the objective lens is provided so as to be capable of rotating about an axis intersecting the optical axis.  
   
   
       4 . A microscope examination apparatus according to  claim 3 , wherein the objective lens is provided so as to be capable of rotating about a principal point of the objective lens.  
   
   
       5 . A microscope examination apparatus according to  claim 3 , wherein the objective lens is provided so as to be capable of rotating about an object point of the objective lens.  
   
   
       6 . A microscope examination apparatus according to  claim 5 , further comprising a correction optical system for correcting shifting of the optical axis by rotating the objective lens.  
   
   
       7 . A microscope examination apparatus according to  claim 1 , wherein the light source and the illumination optical system are provided within the main body.  
   
   
       8 . A microscope examination apparatus according to  claim 1 , wherein the specimen includes a small laboratory animal.