US2007224925A1PendingUtilityA1
Chemical Mechanical Polishing Pad
Est. expiryMar 21, 2026(expired)· nominal 20-yr term from priority
Inventors:Rajeev Bajaj
B24D 11/04B24D 7/14
48
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Claims
Abstract
A polishing pad has polishing elements of at least two different types of materials, each having a different coefficient of friction, and arranged over a surface of the pad so as to provide a non-planar material removal profile for the pad. The polishing elements may be arranged to provide different material removal profiles, such as an edge-fast, edge-slow, center-fast or center-slow material removal profile.
Claims
exact text as granted — not AI-modified1 . A polishing pad, comprising polishing elements of at least two different types of materials, each having a different coefficient of friction, and arranged over a surface of the pad so as to provide a non-planar material removal profile for the pad.
2 . The polishing pad of claim 1 , wherein the polishing elements are arranged to provide an edge-fast material removal profile.
3 . The polishing pad of claim 1 , wherein the polishing elements are arranged to provide an edge-slow material removal profile.
4 . The polishing pad of claim 1 , wherein the polishing elements are arranged to provide a center-fast material removal profile.
5 . The polishing pad of claim 1 , wherein the polishing elements are arranged to provide a center-slow material removal profile.
6 . A polishing pad, comprising a plurality of polishing elements of at least two different materials, each having a different coefficient of friction, and arranged in different densities across a surface of the pad so as to provide a non-planar material removal profile for the pad.
7 . A polishing pad, comprising a plurality of polishing elements, some of which are polyurethane and others of which are Delrin, the polishing elements arranged in a radial manner across a surface of the pad such that those of the polishing elements which are Delrin comprise approximately 5-50% of the total number of polishing elements in locations corresponding to areas of the pad configured to provide relatively lower material removal rates than other areas of the pad.
8 . The polishing pad of claim 7 , wherein an overall density of polishing elements is uniform per unit area of the pad.
9 . The polishing pad of claim 7 , wherein the polishing elements are laid out in a uniform radial arrangement.
10 . The polishing pad of claim 7 , wherein both the Delrin and polyurethane polishing elements have a common shape and size.Cited by (0)
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