Duty Cycle Measurement Apparatus and Method

Abstract

A mechanism for measuring duty cycle of a signal under test in an integrated circuit device, such as a microprocessor or system-on-a-chip is provided. The mechanism generates a frequency which is proportional to the duty cycle and which can be measured using common lab or manufacturing equipment. The mechanism may be implemented using simple circuits in a standard complementary metal oxide semiconductor process which requires very little area and can be powered off when it is not being used. The mechanism may include, for example, a low pass filter, a voltage divider for providing calibration reference voltage signals, a voltage to frequency converter, a frequency divider for dividing a frequency signal output so that the frequency of the signal is within a predetermined range, and an output driver and output pad. From the frequency output signal, a duty cycle of the signal under test may be calculated using off-chip equipment.

1 . A method, in a data processing system, for measuring a duty cycle of a signal under test, comprising: 
 filtering an input signal to generate an output voltage signal;    converting the output voltage signal to a frequency signal that is proportional to the output voltage signal;    measuring a frequency of the frequency signal; and    calculating a duty cycle of the input signal based on the measured frequency.    
   
   
       2 . The method of  claim 1 , further comprising: 
 receiving a plurality of calibration signals and a signal under test;    selecting one of the plurality of calibration signals or the signal under test to be the input signal.    
   
   
       3 . The method of  claim 2 , wherein the plurality of calibration signals are reference voltage signals that are used to calibrate a voltage to frequency converter that converts the output voltage signal to a frequency signal that is proportional to the output voltage signal.  
   
   
       4 . The method of  claim 2 , wherein one of the plurality of calibration signals is selected to be the input signal when performing calibration of a voltage to frequency converter that converts the output voltage signal to a frequency signal that is proportional to the output voltage signal.  
   
   
       5 . The method of  claim 4 , wherein calibrating the voltage to frequency converter comprises generating a calibration curve that maps an input voltage to an output frequency for the plurality of calibration signals.  
   
   
       6 . The method of  claim 1 , wherein the output voltage signal represents an average voltage of the input signal.  
   
   
       7 . The method of  claim 1 , further comprising: 
 receiving, as the input signal, an input voltage signal from a device that is external to the data processing system via a bi-directional pad.    
   
   
       8 . The method of  claim 1 , further comprising: 
 dividing the frequency signal by a predetermined factor to place the frequency signal within a bandwidth requirement for providing the frequency signal to a measurement device for measuring the frequency of the frequency signal.    
   
   
       9 . (canceled)  
   
   
       10 . The method of  claim 1 , wherein the filtering and converting operations are performed on an integrated circuit chip and the measuring and calculating operations are performed externally to the integrated circuit chip.  
   
   
       11 . An apparatus for measuring a duty cycle of a signal under test in an integrated circuit device, comprising: 
 a filter, wherein the filter receives an input signal and outputs an output voltage signal;    a voltage to frequency converter coupled to the filter, wherein the voltage to frequency converter converts the output voltage signal to a frequency signal that is proportional to the output voltage signal; and    an output driver that drives the frequency signal to an output pad coupled to the output driver, wherein a measurement device, external to the integrated circuit device, measures a frequency of the frequency signal at the output pad and calculates a duty cycle for the signal under test based on the measured frequency.    
   
   
       12 . The apparatus of  claim 11 , further comprising: 
 a multiplexer coupled to an input of the filter, wherein the multiplexer receives a plurality of calibration signals and a signal under test, and selects one of the plurality of calibration signals or the signal under test to output to the filter.    
   
   
       13 . The apparatus of  claim 12 , wherein the plurality of calibration signals are reference voltage signals that are used to calibrate the voltage to frequency converter.  
   
   
       14 . The apparatus of  claim 13 , wherein the voltage to frequency converter is calibrated by generating a calibration curve that maps an input voltage to an output frequency for the plurality of calibration signals.  
   
   
       15 . The apparatus of  claim 11 , further comprising: 
 a bi-direction pad coupled to an input of the voltage to frequency converter, wherein an input voltage signal is received, as the input signal, from a device that is external to the apparatus via the bi-directional pad.    
   
   
       16 . (canceled)  
   
   
       17 . The apparatus of  claim 11 , wherein the voltage to frequency converter further comprises a frequency divider coupled to an output of the voltage-controlled oscillator and which divides a frequency of a frequency signal output by the voltage-controlled oscillator by a predetermined amount.  
   
   
       18 . The apparatus of  claim 11 , wherein the apparatus is part of one a toy, a game machine, a game console, a hand-held computing device, a personal digital assistant, a communication device, a wireless telephone, a laptop computing device, a desktop computing device, a server computing devices, and a portable computing device.  
   
   
       19 . The apparatus of  claim 11 , wherein the apparatus is part of a multi-processor system-on-a-chip having at least two heterogeneous processors having different types of instruction sets.  
   
   
       20 . A system-on-a-chip, comprising: 
 a control processor;    at least one co-processor coupled to the control processor; and    a duty cycle measuring apparatus coupled to one or more of the control processor or the at least one co-processor, wherein the duty cycle measuring apparatus comprises: 
 a filter, wherein the filter receives an input signal from one of the control processor or the co-processor and outputs an output voltage signal;  
 a voltage to frequency converter coupled to the filter, wherein the voltage to frequency converter converts the output voltage signal to a frequency signal that is proportional to the output voltage signal; and  
 an output driver that drives the frequency signal to an output pad coupled to the output driver, wherein a measurement device, external to the integrated circuit device, measures a frequency of the frequency signal at the output pad and calculates a duty cycle for the signal under test based on the measured frequency.