Inspecting lighting head system and method of operation

Abstract

A system for high-speed inspection is provided. The system includes a digital camera focused on an inspection location and generating image data. An array of light emitting diodes generates light beams, and one or two lenses collimate the light beams. The angle of incidence of the collimated light on an item at the inspection location is greater than approximately 50 degrees, such as to avoid flashing which can be created by coating on the inspection item or other surface effects. The collimating lenses have a center hole and the digital camera is focused on the inspection location through the center hole.

1 - 20 . (canceled)  
   
   
       21 . A system for high-speed inspection comprising: 
 a digital camera generating image data;    an array of light emitting diodes;    a collimating lens collimating light from the array of light emitting diodes on an inspection location; and    wherein the collimating lens has a top, a bottom, and a perimeter and the array of light emitting diodes is disposed around the perimeter of the collimating lens.    
   
   
       22 . The system of  claim 21  wherein the collimating lens further comprises one or more additional collimating lenses to obtain a predetermined angle of incidence of the collimated light.  
   
   
       23 . The system of  claim 21  wherein the collimating lens has a center and the digital camera is focused on the inspection location through the center.  
   
   
       24 . The system of  claim 21  wherein the digital camera applies a high optical magnification factor, and the collimated light increases a light intensity on the inspection location to allow an exposure time required for the digital camera to generate the image data to be decreased.  
   
   
       25 . The system of  claim 21  further comprising an inspection item having a compound surface, wherein an angle of incidence of the collimated light reduces flashing from the compound surface.  
   
   
       26 . The system of  claim 21  wherein the inspection location is circular having a diameter smaller than 1 mm.  
   
   
       27 . The system of  claim 21  further comprising an inspection system receiving the image data and identifying one or more markings on a surface of an inspection item.  
   
   
       28 . The system of  claim 21  further comprising: 
 a character recognition system receiving the image data and identifying one or more characters in the image data; and    a pass/fail system generating pass/fail data for an inspection item based on the one or more characters or an absence of the one or more characters.    
   
   
       29 . A system for high-speed inspection comprising: 
 a digital camera focused on an inspection location;    an array of light emitting diodes;    a collimating lens having a top, a bottom, and a hole at the center, wherein the array of light emitting diodes is disposed at the top of and around a periphery of the collimating lens, the collimating lens receiving light from the array of light emitting diodes and emitting collimated light;    an inspection item having a compound on a surface of the inspection item, the inspection item disposed at the inspection location; and    wherein the digital camera is focused on the inspection item through the hole of the collimating lens.    
   
   
       30 . The system of  claim 29  wherein an angle of incidence of the collimated light on the inspection item mitigates flashing caused by the compound on the surface of the inspection item.  
   
   
       31 . The system of  claim 30  wherein the angle of incidence is greater than approximately 50 degrees.  
   
   
       32 . A method for inspecting an item comprising: 
 generating light from a light source;    collimating the light so as to direct the collimated light onto an inspection site at a predetermined angle of incidence to mitigate flashing from an inspection item having a surface coated with a compound.    
   
   
       33 . The method of  claim 32  further comprising generating digital image data of the inspection item at a high speed, wherein the collimated light reduces a time required to generate the digital image data of the inspection item by increasing a light intensity on the inspection item.  
   
   
       34 . The method of  claim 32  wherein generating the light comprises generating a ring-shaped light beam from an array of light emitting diodes.  
   
   
       35 . The method of  claim 32  wherein collimating the light comprises providing a second collimating lens between the collimated light and the inspection item to collimate the light at the predetermined angle of incidence.  
   
   
       36 . The method of  claim 32  wherein the predetermined angle of incidence is greater than 50 degrees.  
   
   
       37 . The method of  claim 32  further comprising: 
 generating digital image data of the inspection item and    detecting data from the surface of the inspection item underneath the compound in the digital image data.    
   
   
       38 . The method of  claim 32  further comprising: 
 generating image data of the inspection item using a camera; and    detecting data from the inspection item in the image data.    
   
   
       39 . The method of  claim 32  wherein a tip of a conical ring-shaped light beam from the light source has a diameter smaller than 1 mm.  
   
   
       40 . The method of  claim 32  further comprising: 
 generating image data of the inspection item using a digital camera;    detecting marking data from the inspection item in the image data; and    generating an indication if the marking data does not match predetermined marking data.