US2008211529A1PendingUtilityA1

Integrated circuit for being applied to electronic device, and associated testing system

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Assignee: CHEN YI-CHUANPriority: Nov 8, 2005Filed: Apr 9, 2008Published: Sep 4, 2008
Est. expiryNov 8, 2025(expired)· nominal 20-yr term from priority
Inventors:Yi-Chuan ChenHong-Ching Chen
G01R 31/31719
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Claims

Abstract

An integrated circuit (IC) for being applied to an electronic device includes: a control circuit for controlling the electronic device; and a signal generation unit coupled to the control circuit for generating at least one signal inside the IC as an output signal and outputting the output signal to another IC for testing. A testing system includes at least one testing device and a plurality of ICs that are tested by the testing device. The ICs are coupled to the testing device. Each IC of the ICs is for being applied to an electronic device and includes: a control circuit for controlling the electronic device; and a signal generation unit coupled to the control circuit for generating at least one signal inside the IC as an output signal and outputting the output signal to one of the other IC(s) for testing.

Claims

exact text as granted — not AI-modified
1 . An integrated circuit (IC) for being applied to an electronic device, comprising:
 a control circuit for controlling the electronic device; and   a signal generation unit for generating at least one signal inside the IC as an output signal and outputting the output signal to another IC for testing.   
   
   
       2 . The IC of  claim 1 , wherein the ICs are the same ICs. 
   
   
       3 . The IC of  claim 1 , wherein at least one of the ICs is in a test mode. 
   
   
       4 . The IC of  claim 1 , wherein the electronic device is an optical disc drive, and the signal generated by the signal generation unit comprises a writing signal. 
   
   
       5 . The IC of  claim 1 , wherein the electronic device is an optical disc drive, and the signal generated by the signal generation unit comprises at least one interface signal. 
   
   
       6 . A testing system comprising:
 at least one testing device; and   a first integrated circuit (IC) and a second IC that are tested by the testing device, the first IC and the second IC being coupled to the testing device, wherein each IC of the ICs is for being applied to an electronic device and comprises:
 a control circuit for controlling the electronic device; and 
 a signal generation unit for generating at least one signal inside the IC as an output signal and outputting the output signal to one of the other IC(s) for testing. 
   
   
   
       7 . The testing system of  claim 6 , wherein the first IC and the second IC are the same ICs. 
   
   
       8 . The testing system of  claim 6 , wherein at least one of the first IC and the second IC is in a test mode. 
   
   
       9 . The testing system of  claim 6 , wherein the electronic device is an optical disc drive.

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