US2008236263A1PendingUtilityA1
Method and device for analyzing a sensor element
Est. expiryOct 26, 2024(expired)· nominal 20-yr term from priority
Inventors:Uwe Kassner
G01L 23/22F02D 2041/281F02D 41/28F02D 2041/285F02D 35/025F02D 35/023G01L 9/085G01L 23/10G01M 99/00G01L 27/00
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Abstract
A method and a device for analyzing a sensor element are described, which allow a temperature dependence of the sensor element to be considered without an additional temperature sensor in particular. The sensor element outputs a signal as a function of a measured variable. The signal of the sensor element is analyzed in a first analysis operating mode to detect the measured variable. The signal of the sensor element is analyzed in a second analysis operating mode to detect a characteristic variable of the sensor element which is different from the measured variable.
Claims
exact text as granted — not AI-modified1 . A method for analyzing a sensor element which outputs a signal as a function of a measured variable, comprising:
analyzing the signal of the sensor element in a first analysis operating mode to detect the measured variable; and analyzing the signal of the sensor element in a second analysis operating mode to detect a characteristic variable of the sensor element which is different from the measured variable.
2 . The method as recited in claim 1 , wherein a changeover between the first analysis operating mode and the second analysis operating mode is performed as a function of at least one controlled variable.
3 . A device for analyzing a sensor element which outputs a signal as a function of a measured variable, comprising:
a first analysis arrangement configured to analyze the signal of the sensor element to detect the measured variable, in a first analysis operating mode; and a second analysis arrangement configured analyze the signal of the sensor element to detect a characteristic variable of the sensor element which is different from the measured variable, in a second analysis operating mode.Cited by (0)
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