US2008261178A1PendingUtilityA1
Process for providing a topography to the surface of a dental implant
Est. expiryApr 19, 2027(~0.7 yrs left)· nominal 20-yr term from priority
A61K 6/822A61C 13/206A61C 8/0012C04B 41/5353C04B 2111/00836C04B 41/009C04B 41/91A61L 2430/12A61C 2008/0046A61K 6/824A61C 8/0037A61C 13/00A61K 6/818C23F 1/30A61L 27/10A61C 8/00
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Claims
Abstract
A process for providing a topography to the surface of a dental implant, said surface being made of a ceramic material. At least a part of the surface of the dental implant is etched with an etching solution comprising hydrofluoric acid at a temperature of at least 70° C. Thereby, discrete grains or agglomerates of grains are removed from the ceramic material.
Claims
exact text as granted — not AI-modified1 . A process for providing a topography to the surface of a dental implant, said surface being made of a ceramic material, wherein at least a part of the surface of the dental implant is etched with an etching solution comprising hydrofluoric acid at a temperature of at least 70° C., thereby removing discrete grains or agglomerates of grains from the ceramic material.
2 . Process according to claim 1 , the ceramic material having an average grain size from 0.1 μm to 0.6 μm.
3 . Process according to claim 1 or 2 , the ceramic material being based on zirconia.
4 . Process according to claim 3 , the ceramic material being yttria-stabilized zirconia.
5 . Process according to claim 4 , the composition of the yttria-stabilized zirconia comprising 4.5 to 5.5 weight-% of Y 2 O 3 and less than 5 weight-% of HfO 2 , the total amount of ZrO 2 , Y 2 O 3 and HfO 2 being more than 99.0 weight-%.
6 . Process according to claim 4 , wherein prior to the etching a roughness is provided to the surface of the dental implant by sandblasting, milling and/or injection molding techniques.
7 . Process according to claim 4 , wherein the etching solution comprises at least 50 vol.-% of concentrated hydrofluoric acid.
8 . Process according to claim 1 , wherein the etching solution further comprises at least one compound selected from the group consisting of phosphoric acid, nitric acid, ammonium fluoride, sulfuric acid, hydrogen peroxide and bromic acid.
9 . Process according to claim 1 , wherein the etching solution further comprises sulfuric acid in an amount of 50 vol.-% at most.
10 . Process according to claim 4 , wherein the etching is performed for 1 minute to 60 minutes.
11 . Process according to claim 4 , wherein the etching is followed by washing the dental implant, the washing comprising the subsequent step or the subsequent steps of
c) rinsing the dental implant with a NaCl solution and/or d) rinsing the dental implant with deionized water.
12 . Dental implant obtainable by the process of claim 4 .
13 . Dental implant according to claim 12 , the dental implant being a one-part dental implant.Join the waitlist — get patent alerts
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