Method and apparatus for high resolution coherent optical imaging

Abstract

A method and an apparatus for examining the sub-surface microstructure of a sample are provided. Radiation from a plurality of optical radiation sources travels along a first optical path. In the first optical path, a device focuses the optical radiation from each of the optical sources into a plurality of respective focal points along the first optical path to provide substantially continuous coverage of a selected portion of the first optical path. Then, a sample on the first optical path within the selected length extending into the sample is scanned along said selected portion of the first optical path.

1 . An N channel apparatus for optical examination of a sample, wherein the N channel apparatus comprises a plurality of optical networks and a reference arm, each optical network providing one channel for the N channel apparatus and sharing the reference arm. 
     
     
         2 . An N channel apparatus as claimed in  claim 1 , wherein the optical network comprises a detector, an optical coupling means and a sample arm, wherein the optical coupling means is configured to receive optical radiation from a previous optical network and to transmit optical radiation to a next optical network, said optical radiation comprising radiation from an optical source for illuminating a sample and a visible light source for guiding the orientation of the N channel apparatus. 
     
     
         3 . An N channel apparatus as claimed in  claim 2 , wherein the sample arm comprises a polarization control means, a variable delay element and a sample. 
     
     
         4 . An N channel apparatus as claimed in  claim 1 , wherein the reference arm comprises a tree coupling means, a phase modulating means and an optical delay means.