US2009025491A1PendingUtilityA1
Method for use in monitoring a swab technique
Est. expiryApr 1, 2024(expired)· nominal 20-yr term from priority
Y10T156/10G01N 33/528
37
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
A device for use in monitoring a swab method, the device includes a first substrate substantially adjacent a second substrate, the first substrate and the second substrate having disposed therebetween a test material.
Claims
exact text as granted — not AI-modified1 - 19 . (canceled)
20 . A method of manufacturing a device, for use in monitoring a swab technique, the method including providing a first substrate, applying a test material to a portion of the first substrate, covering at least the test material on the first substrate with a second substrate, and joining the second substrate to the first substrate so as to encapsulate the test material between the first substrate and the second substrate.
21 . A method according to claim 20 , wherein the test material is applied to the first substrate as a (relatively) dry, localized spot, (which is particularly preferred) or as a homogeneously applied film.
22 . A method of monitoring a swab technique, which method includes:
a) providing a device comprising a first substrate substantially adjacent a second substrate, the first substrate and the second substrate having disposed therebetween a test material including a predetermined amount of an analyte; b) swabbing the test material with a swab; and monitoring the amount of analyte present on the swab in step (b).
23 . A method according to claim 22 , wherein the test material is disposed between the first substrate and the second substrate under aseptic conditions.Join the waitlist — get patent alerts
Track US2009025491A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.