US2009039439A1PendingUtilityA1
Integration Scheme for Dual Work Function Metal Gates
Est. expiryMar 30, 2027(~0.7 yrs left)· nominal 20-yr term from priority
H10D 64/0132H10D 30/601H10D 30/0227H10D 64/021H10D 64/017H10D 30/0212H10D 84/0177H10D 84/038
50
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
A method for making PMOS and NMOS transistors 60, 70 on a semiconductor substrate includes having a gate hardmask over the gate electrode layer during the formation of transistor source/drain regions. The method includes an independent work function adjustment process that implants Group IIIa series dopants into a gate polysilicon layer of a PMOS transistor and implants Lanthanide series dopants into a gate polysilicon layer of NMOS.
Claims
exact text as granted — not AI-modified1 - 49 . (canceled)
50 . An NMOS transistor, comprising:
a semiconductor substrate; a gate dielectric coupled to said semiconductor substrate; a fully silicided gate electrode coupled to said gate dielectric; and source/drain regions located within said semiconductor substrate; wherein said fully silicided gate electrode of said NMOS transistor includes a lanthanide series dopant.
51 . The NMOS transistor of claim 50 wherein said fully silicided gate electrode also include an As dopant.
52 . The NMOS transistor of claim 50 wherein said lanthanide series dopant is Yb.
53 . The NMOS transistor of claim 50 wherein said gate dielectric includes a lanthanide series dopant.
54 . The NMOS transistor of claim 53 wherein said lanthanide series dopant is Yb.
55 . A PMOS transistor, comprising:
a semiconductor substrate; a gate dielectric coupled to said semiconductor substrate; a fully silicided gate electrode coupled to said gate dielectric; source/drain regions located within said semiconductor substrate; wherein said fully silicided gate electrode of said PMOS transistor includes a Group IIIa dopant.
56 . The PMOS transistor of claim 55 wherein said fully silicided gate electrode also includes oxygen.
57 . The PMOS transistor of claim 55 wherein said Group IIIa dopant is Ga.
58 . The PMOS transistor of claim 55 wherein said gate dielectric includes a Group IIIa dopant.
59 . The PMOS transistor of claim 58 wherein said Group IIIa dopant is Ga.Join the waitlist — get patent alerts
Track US2009039439A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.