Organic el panel and method of manufacturing the same

Abstract

The present invention is to ensure that when it has been judged that film-formation areas of a plurality of layers laminated on the same luminescent areas of organic EL devices involve a defect, it is possible to exactly find which layer of the multi-laminated layers is a defective layer. The film formation areas of layers to be laminated on luminescent area are formed in a manner such that overlap deviations e 1 -e 3 are intentionally formed.

1 . A method of manufacturing an organic EL panel having a substrate and organic EL devices formed above the substrate, each organic EL device including a pair of electrodes, an organic layer interposed between the pair of electrodes, said organic layer being formed by laminating a plurality of film layers including an organic luminescent layer, said method comprising:
 a film formation step in which film formation areas of layers which are essential for forming organic EL devices are formed on luminescent areas of the organic EL devices corresponding to the pattern of a film formation mask having a plurality of openings,   wherein in the film formation step, overlap deviations which can be used to identify each of the plurality of film layers, are formed on the film formation areas of several layers laminated on an identical luminescent area.   
   
   
       2 . The method of manufacturing an organic EL panel according to claim  6 , wherein overlap deviations are formed by intentionally deviating the position of the film formation mask when forming each film layer. 
   
   
       3 . The method of manufacturing an organic EL panel according to claim  7 , wherein the film formation mask has a pattern including a plurality of linear openings, the position of the film formation mask is successively deviated for several film formations along the longitudinal direction of the pattern. 
   
   
       4 . The method of manufacturing an organic EL panel according to claim  7  or  8 , wherein an amount of an overlap deviation of the mask for each film layer is set to be larger than an estimated deviation amount, while the maximum deviation amount is set within a range such that film formation area does not go beyond luminescent area. 
   
   
       5 . The method of manufacturing an organic EL panel according to claim  6  or  7 , wherein an inspection step is performed after the film formation step, so as to carry out an eye-inspection or an image processing on the film formation state of film formation area.