US2009120459A1PendingUtilityA1
Apparatus and method for cleaning semiconductor substrates
Est. expiryAug 19, 2023(expired)· nominal 20-yr term from priority
H10P 52/00B08B 3/02B08B 3/048
54
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
An apparatus for cleaning semiconductor substrates includes a chamber having a cleaning room and a drying room disposed over the cleaning room. The cleaning room and the drying room are separated or placed in communication with one another by a separation plate. An exhaust path is formed at a central portion of the separation plate. As de-ionized water (DI water) filling the cleaning room is drained during a dry process, the inside of the drying room is decompressed, and a drying fluid in the drying room flows from the drying room to the cleaning room along the exhaust path.
Claims
exact text as granted — not AI-modified1 . A method for cleaning semiconductor substrates by using a chamber including a cleaning room in which the substrates are cleaned and a drying room in which the substrates are dried, the method comprising the steps of:
disposing the substrates in the cleaning room; supplying a cleaning solution to the cleaning room to clean the substrates; moving a supporter, in which the substrates are placed, to the drying room; moving a separation plate, in which an exhaust path is formed, between the cleaning room and the drying room to separate the drying room from the cleaning room; and supplying a drying fluid to the drying room to dry the substrates.
2 . The method of claim 1 , wherein the step of drying the substrates comprises the steps of:
draining the cleaning solution filling the cleaning room to the outside to decompress the inside of the drying room; and exhausting the drying fluid supplied to the drying room from the drying room through the exhaust path formed in the separation plate.
3 . The method of claim 2 , wherein the step of drying the substrates further comprises a step of exhausting the drying fluid flowing into the cleaning room through an exhaust port formed at the sidewall of the cleaning room while the cleaning solution is drained through a drainpipe of the cleaning room.
4 . The method of claim 3 , wherein the step of drying the substrates further comprises the steps of:
closing the exhaust port when the cleaning solution is completely drained from the cleaning room; and exhausting the drying fluid flowing into the cleaning room through the drainpipe of the cleaning room.
5 . The method of claim 4 , wherein the drainpipe is connected to the bottom of the cleaning room, and the drain of the cleaning solution from the cleaning room is achieved by gravity.
6 . The method of claim 1 , wherein the step of drying the substrates comprises the steps of:
supplying alcohol vapor onto the substrate; and supplying a heated dry gas onto the substrate.
7 . The method of claim 6 , wherein the alcohol vapor is isopropyl alcohol, and the dry gas is nitrogen gas.Join the waitlist — get patent alerts
Track US2009120459A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.