US2009202742A1PendingUtilityA1

Organometallic precursor compounds

Assignee: MEIERE SCOTT HOUSTONPriority: Jan 19, 2005Filed: Apr 22, 2009Published: Aug 13, 2009
Est. expiryJan 19, 2025(expired)· nominal 20-yr term from priority
C23C 16/18B22F 9/30
62
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

This invention relates to organometallic precursor compounds represented by the formula (L)M(L′) 2 (NO) wherein M is a Group 6 metal, L is a substituted or unsubstituted anionic ligand and L′ is the same or different and is a π acceptor ligand, a process for producing the organometallic precursor compounds, and a method for producing a film, coating or powder from the organometallic precursor compounds.

Claims

exact text as granted — not AI-modified
1 - 41 . (canceled) 
   
   
       42 . A method for producing a film, coating or powder by decomposing an organometallic precursor compound represented by the formula (L)M(L′) 2 (NO) wherein M is a Group 6 metal, L is a substituted or unsubstituted cyclopentadienyl ligand, L′ is the same or different and is a π acceptor ligand, thereby producing the film, coating or powder. 
   
   
       43 . The method of  claim 42 , where the organometallic precursor compound is represented by the formula (RL)M(L′) 2 (NO) wherein M is a Group 6 metal, L is a substituted cyclopentadienyl ligand, R is an alkyl having from 1 to 8 carbons atoms or SiMe 3 ; L′ is the same or different and is a π acceptor ligand, thereby producing the film, coating or powder. 
   
   
       44 . The method of  claim 42 , wherein M is selected from molybdenum, chromium or tungsten. 
   
   
       45 . The method of  claim 42  wherein the decomposing of said organometallic precursor compound is thermal, chemical, photochemical or plasma-activated. 
   
   
       46 . The method of claim of  claim 42 , wherein said organometallic precursor compound is evaporated and the vapor is directed into a deposition reactor housing a substrate. 
   
   
       47 . The method of  claim 45  wherein said substrate is comprised of a material selected from the group consisting of a metal, a metal silicide, a semiconductor, an insulator and a barrier material. 
   
   
       48 . The method of  claim 46  wherein said substrate is a patterned wafer. 
   
   
       49 . The method of  claim 42  wherein said film, coating or powder is produced by a gas phase deposition.

Join the waitlist — get patent alerts

Track US2009202742A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.