Luminescence Microscopy with Enhanced Resolution

Abstract

The invention is directed to a resolution-enhanced luminescence microscopy method in which a sample is excited to the emission of luminescence radiation through irradiation by excitation radiation, and an image of the luminescing sample is acquired. A first partial volume of the sample is irradiated by a first laser radiation field of the excitation radiation, and a second partial volume of the sample is irradiated by a second laser radiation field of the excitation radiation. The first partial volume of the sample and the second partial volume of the sample overlap one another partially but not completely. Only the first laser radiation field is modulated with a first frequency, and luminescence radiation is detected from the first partial volume of the sample with modulation filtering so that luminescence radiation from the second partial volume of the sample is suppressed.

1 . A method for resolution-enhanced luminescence microscopy comprising exciting a sample to the emission of luminescence radiation through irradiation by excitation radiation, and acquiring an image of the luminescing sample, wherein a first partial volume of said sample is irradiated by a first laser radiation field of the excitation radiation, and a second partial volume of said sample is irradiated by a second laser radiation field of the excitation radiation, wherein said first partial volume of said sample and said second partial volume of said sample overlap one another partially but not completely, only the first laser radiation field is modulated with a first frequency, and luminescence radiation is detected from the first partial volume of the sample with modulation filtering so that luminescence radiation from the second partial volume of the sample is suppressed. 
   
   
       2 . The method according to  claim 1 , wherein said second partial volume of said sample is brought to luminescence saturation by said second laser radiation field. 
   
   
       3 . The method according to  claim 1 , wherein the intensity of said second laser radiation field is at least 50-times greater than that of the first laser radiation field. 
   
   
       4 . the method according to  claim 1 , wherein the intensity of said second laser radiation field is at least 100-times greater than that of the first laser radiation field. 
   
   
       5 . The method according to  claim 1 , wherein at least said first laser radiation field is focused on said sample in a diffraction-limited manner. 
   
   
       6 . The method according to  claim 1 , wherein said second laser radiation field is modulated with a second frequency that differs from the first frequency. 
   
   
       7 . The method according to  claim 1 , wherein modulation-filtering detection is carried out by lock-in technique. 
   
   
       8 . The method according to  claim 1 , wherein the first frequency is between 1 MHz and 100 MHz. 
   
   
       9 . A resolution-enhanced luminescence microscope comprising means for irradiating a sample with excitation radiation for exciting the emission of luminescence radiation, and means for acquiring images of the luminescing sample, wherein the means for irradiating with excitation radiation have means for irradiating a first partial volume of the sample with a first laser radiation field and means for irradiating a second partial volume of the sample with a second laser radiation field, wherein the first partial volume of the sample and the second partial volume of the sample overlap one another partially but not completely, said means for irradiating the sample with the first laser radiation field having a modulatory which modulates the first laser radiation field with a first frequency, and said means for acquiring images detect luminescence radiation from the first partial volume of said sample with modulation filtering so that the luminescence radiation from the second partial volume of the sample is suppressed by the filtering. 
   
   
       10 . The microscope according to  claim 9 , wherein said second partial volume of the sample is brought to luminescence saturation by the means for irradiating with second laser radiation field. 
   
   
       11 . The microscope according to  claim 9 , wherein the intensity of the second laser radiation field is at least 50-times greater than that of the first laser radiation field. 
   
   
       12 . The microscope according to  claim 9 , wherein the intensity of the second laser radiation field is at least 100-times greater than that of the first laser radiation field. 
   
   
       13 . The microscope according to  claim 9 , further comprising optics which focus the laser radiation for the first laser radiation field on the sample in a diffraction-limited manner. 
   
   
       14 . The microscope according to according to  claim 9 , wherein a modulator is provided which modulates the second laser radiation field with a second frequency that differs from the first frequency. 
   
   
       15 . The microscope according to  claim 9 , wherein said means for acquiring images have a lock-in amplifier, the first frequency and the signals of a detector being fed to the lock-in amplifier. 
   
   
       16 . The microscope according to  claim 9 , wherein the first frequency is between 1 MHz and 100 MHz.