Method and apparatus for radiation detection

Abstract

An imaging system for imaging an object has an x-ray source for emitting x-rays. A detection system has a plurality of position sensitive detector planes, and the object is located between the x-ray source and the detection system. A portion of the x-rays pass through said object and pass into said plurality of detector planes and are detected within the plurality of detector planes. A multi-channel readout system is coupled to the plurality of position sensitive detector planes. A display system is coupled to the multi-channel readout system, and the display system displays an image of said object. A portion of the x-rays passing into the plurality of detector planes undergoes at least one Compton scatter within the plurality of detection planes and is detected. A total or partial energy corresponding to each portion of the emitted x-rays is recorded by a multichannel readout system. The direction for the said detected x-ray is determined and the direction and total or partial energy corresponding to each detected x-ray is processed by a multi-channel readout system to generate said image.

1 . A detector system comprising:
 a first scintillator;   at least two first scintillator light detectors coupled to said first scintillator; and   a board, wherein said first scintillator and said first scintillator light detectors are mounted upon said board.   
     
     
         2 . The detector system of  claim 1 , further comprising a second scintillator with at least two second scintillator light detectors coupled to said second scintillator, wherein said second scintillator is mounted on said board on a side of said first scintillator to form a detector array. 
     
     
         3 . The detector system of  claim 1 , wherein said first scintillator comprises a detector material selected from the group of detector materials consisting of CsI(Tl), CdWo 4 , CsF, NaI(Tl), CsI(Na), BGO, LSO, PbCO 3  and GSO. 
     
     
         4 . The detector system of  claim 1 , wherein said at least two first scintillator light detectors are selected from the group of light detectors consisting of diodes, photodiodes, avalanche photodiodes (APDs), photomultiplier tubes (PMTs), and Multi Anode PMTs. 
     
     
         5 . A method of detecting a direction of a photon, comprising the steps of:
 positioning a first detector to receive a photon to create a first interaction in said first detector;   determining a position of said first interaction;   producing a recoil electron at said first interaction;   positioning a second detector to receive said recoil electron to create a second interaction in said second detector;   determining a position of said second interaction;   determining a direction of a recoil of said recoil electron using said position of said first interaction and said position of said second interaction; and   determining a direction of said photon using said direction of said recoil.   
     
     
         6 . The method of  claim 5 , further comprising determining an energy of said first interaction and said second interaction. 
     
     
         7 . The method of  claim 5 , further comprising positioning a third detector to receive said recoil electron to create a third interaction in said third detector. 
     
     
         8 . The method of  claim 5 , further comprising scattering a photon in said first detector to create said first interaction. 
     
     
         9 . A detector system for detecting a plurality of particles, said detector system comprising:
 an imaging detector, wherein a portion of said plurality of particles produces a plurality of signals in said imaging detector;   a carrier with a first side coupled to said imaging detector to receive said plurality of signals from said imaging detector, wherein said first side of said carrier comprises at least one conductive path; and   an integrated circuit with at least one input coupled to a second side of said carrier to receive said plurality of signals from said carrier, wherein said second side of said carrier comprises at least one conductive path, and wherein said integrated circuit processes a portion of said plurality of signals to produce an output.   
     
     
         10 . The detector system of  claim 9 , wherein said imaging detector is selected from the group consisting of pixel detectors, strip detectors, double sided pixel detectors and double sided strip detectors. 
     
     
         11 . The detector system of  claim 9 , wherein the detector material of said imaging detector is selected from the group consisting of HpGe, Ge, CdTe, CdZnTe, HgI 2 , GaAs, PbI 2 , CsI(Tl), CdWo 4 , CsF, NaI(Tl), CsI(Na), BGO, LSO, PbCO 3  and GSO. 
     
     
         12 . A detector system for detecting a plurality of particles, comprising:
 a plurality of imaging detectors, wherein a portion of said plurality of particles produces a plurality of signals in said plurality of imaging detectors;   a plurality of carriers, wherein a first side of a portion of said plurality of carriers is coupled to a portion of said plurality of imaging detectors to receive said plurality of signals from said plurality of imaging detectors, wherein said first side of said portion of said plurality of carriers comprises a plurality of conductive paths; and   a plurality of integrated circuits with a plurality of inputs coupled to a second side of at least one portion of said plurality of carriers to receive said plurality of signals from said carriers, wherein said second side of said plurality of inputs comprises a plurality of conductive paths, and wherein a portion of said plurality of integrated circuits process a portion of said plurality of signals to produce an output.   
     
     
         13 . The detector system of  claim 12 , wherein a portion of said plurality of position sensitive detectors are selected from the group consisting of pixel detectors, strip detectors, double sided pixel detectors and double sided strip detectors. 
     
     
         14 . The detector system of  claim 9 , wherein said imaging detector comprises at least two position sensitive detectors. 
     
     
         15 . The detector system of  claim 12 , wherein the detector material of a portion of said plurality of imaging detectors is selected from the group consisting of HpGe, Ge, CdTe, CdZnTe, HgI 2 , GaAs, PbI 2 , CsI(Tl), CdWo 4 , CsF, NaI(Tl), CsI(Na), BGO, LSO, PbCO 3  and GSO. 
     
     
         16 . The detector system of  claim 9 , wherein said imaging detector comprises a direct conversion detector. 
     
     
         17 . The detector system of claim  125 , wherein a formation design of said plurality of imaging detectors are selected from the group consisting of a one-side, a two-side, a three-side and a four-side abuttable design. 
     
     
         18 . A method for producing at least one four side abuttable detector module for detecting a plurality of particles, said method comprising:
 mounting an imaging detector onto a first side of a carrier comprising a plurality of conductive paths, wherein said first side of said carrier has a surface area that is at most as large as a side of said imaging detector;   coupling an integrated circuit to a second side of said carrier comprising a plurality of conductive paths, wherein said second side of said carrier has a surface area that is at most as large as a side of said integrated circuit;   detecting a portion of said plurality of particles by said imaging detector;   producing a plurality of signals that travels from said imaging detector through said carrier to said integrated circuit; and   processing said portion said plurality of signals using said integrated circuit; and   producing an output from said portion of said plurality of signals using said integrated circuit.   
     
     
         19 . The method of  claim 18 , wherein said imaging detector is selected from the group consisting of pixel detectors, strip detectors, double sided pixel detectors and double sided strip detectors. 
     
     
         20 . The method of  claim 18 , wherein a portion of said plurality of particles are selected from the group consisting of photons, electrons, positrons, protons, alpha particles, x-rays and gamma rays. 
     
     
         21 . A detector system for detecting a plurality of particles, said detector system comprising:
 a detector, wherein said detector comprises a scintillator coupled to a solid-state light detector that is configured to produce a plurality of signals from a plurality of scintillation light from said plurality of particles;   a board comprising a conductive path that is configured to receive a portion of said plurality of signals from said detector, wherein said detector is mounted to a first side of said board; and   an integrated circuit comprising a plurality of inputs that is configured to receive a portion of said plurality of signals from said board and is configured to process a portion of said plurality of signals to produce an output, wherein said integrated circuit is mounted on a second side of said board.   
     
     
         22 . The detector system of  claim 21 , wherein said scintillator is selected from the group consisting of CsI(Tl), CdWo 4 , CsF, NaI(Tl), CsI(Na), BGO, LSO, PbCO 3  and GSO. 
     
     
         23 . The detector system of  claim 21 , wherein said solid-state light detector is selected from the group consisting of diodes, photodiodes, PIN photodiodes, and avalanche photodiodes (APDs). 
     
     
         24 . The detector system of  claim 21 , wherein at least one portion of said plurality of particles are selected from the group consisting of photons, electrons, positrons, protons, alpha particles, x-rays and gamma rays. 
     
     
         25 . The detector system of  claim 9 , wherein a portion of said plurality of particles are selected from the group consisting of photons, electrons, positrons, protons, alpha particles, x-rays and gamma rays. 
     
     
         26 . The detector system of  claim 12 , wherein a portion of said plurality of particles are selected from the group consisting of photons, electrons, positrons, protons, alpha particles, x-rays and gamma rays. 
     
     
         27 . The method of  claim 18 , wherein at least one portion of said plurality of particles are selected from the group consisting of photons, electrons, positrons, protons, alpha particles, x-rays and gamma-rays. 
     
     
         28 . The detector system of  claim 25 , wherein a portion of said plurality particles said photons, said x-rays and said gamma-rays make at least one Compton scatter inside said imaging detector. 
     
     
         29 . A method for detecting a plurality of particles, comprising:
 detecting a portion of said plurality of particles by an imaging detector;   producing a plurality of signals from said plurality of particles using said imaging detector;   coupling said imaging detector to a first side of a carrier comprising a plurality of conductive pads and paths, wherein said first side of said carrier has an output surface area that is at most a surface area of a side of said imaging detector;   coupling an integrated circuit with a plurality of inputs to a second side of said carrier comprising a plurality of conductive pads and paths wherein said second side of said carrier has an output surface area that is at most a surface area of a side of said imaging detector; and   processing a portion of said plurality of signals by said integrated circuit and producing an output.   
     
     
         30 . A method for detecting a plurality of particles, comprising:
 detecting a portion of said plurality of particles using an imaging detector;   producing a plurality of signals from said plurality of particles using said imaging detector, wherein said imaging detector comprises a scintillator coupled to a solid-state light detector;   coupling said imaging detector to a first side of a carrier comprising a plurality of connections wherein said first side of said carrier has an output surface area that is at most a surface area of a side of said imaging detector;   coupling an integrated circuit with a plurality of inputs to a second side of said carrier comprising a plurality of connections, wherein said second side of said carrier has an output surface area that is at most a surface area of a side of said imaging detector; and   processing a portion of said plurality of signals using said integrated circuit; and   producing an output from said plurality of signals using said integrated circuit.   
     
     
         31 . The method of  claim 30 , wherein said plurality of particles are selected from the group consisting of photons, electrons, positrons, protons, alpha particles, x-rays and gamma rays.