US2010031225A1PendingUtilityA1
Methods and systems for pattern generation based on multiple forms of design data
Est. expirySep 26, 2025(expired)· nominal 20-yr term from priority
Inventors:Lars Ivansen
H01J 37/3174G03F 7/2063G03F 1/78B82Y 40/00B82Y 10/00G03F 7/70508G03F 1/68
55
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Abstract
In a pattern generation method, properties of designs are extracted in a mask data preparation system, and the properties are propagated to a lithography write system. A pattern is generated based on fractured design data and the extracted properties. By preserving the design intent to the lithography write system, the fidelity of the pattern replication may improve.
Claims
exact text as granted — not AI-modified1 . A pattern generation method, the method comprising:
receiving fractured design data and metadata; and generating a pattern based on the fractured design data and the metadata; wherein
the metadata describes the design data prior to fracturing.
2 . The pattern generation method of claim 1 , wherein the metadata is received in a data flow different from a data flow associated with the fractured polygon representation.
3 . The pattern generation method of claim 1 , wherein the metadata and the fractured polygon representation are received in a bundled data flow.
4 . The pattern generation method of claim 1 , wherein the metadata includes properties associated with at least one of corners and edges of the pattern.
5 . The pattern generation method of claim 1 , wherein the metadata includes at least one of spatial location data, opening angle data, orientation data and isolation data associated with at least one corner of the pattern.
6 . An apparatus in a lithographic system, the apparatus comprising:
means for receiving fractured design data and metadata; means for generating a pattern based on the received fractured design data and the received metadata.Cited by (0)
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