Probe card substrate with bonded via

Abstract

The present invention is directed to a probe head having a probe contactor substrate with at least one slot that passes through the probe contactor substrate, at least one probe contactor adapted to test a device under test, with the probe contactor being coupled to the a top side of the probe contactor substrate and electrically connected to a terminal also disposed on top of the probe contactor substrate, and a space transformer having at least one bond pad coupled to a top side of the space transformer, and a bond interconnect which electrically couples the bond pad to the terminal through the slot in the probe contactor substrate.

1 . A probe head subassembly comprising:
 at least one probe contactor substrate having at least one hole that passes through the probe contactor substrate;   at least one probe contactor, the probe contactor being coupled to a top side of the probe contactor substrate and electrically coupled to a terminal also coupled to the top side of the probe contactor substrate;   a space transformer coupled to the probe contactor substrate, the space transformer having at least one bond pad coupled to a top side of the space transformer, the bond pad electrically coupled to a via, the via providing electrical communication from the top side of the space transformer to a bottom side of the space transformer; and   a bond interconnect which electrically connects the at least one bond pad to the terminal through the hole in the probe contactor substrate.   
     
     
         2 . The probe head of  claim 1 , wherein the bond interconnect is a wire bond. 
     
     
         3 . The probe head of  claim 1 , wherein the probe contactor is lithographically formed on the probe contactor substrate. 
     
     
         4 . The probe head of  claim 1 , wherein the probe contactor substrate is ceramic. 
     
     
         5 . The probe head of  claim 1 , further including a plurality of terminals coupled to the top side of the probe contactor substrate, and a plurality of bond pads coupled to the top side of the space transformer and wherein each bond pad of the plurality of bond pads is connected to a respective terminal of the plurality of terminals through the hole in the probe contactor substrate. 
     
     
         6 . The probe head of  claim 1 , wherein the bond interconnect is a conductive adhesive. 
     
     
         7 . The probe head of  claim 1 , wherein the space transformer is a multi-layer wiring board. 
     
     
         8 . A method of forming a probe head comprising:
 forming a plurality of probe contactors on a top side of a probe contactor substrate;   forming a hole which passes completely through a top side of the probe contactor substrate to a bottom side of the probe contactor substrate; and   electrically coupling a plurality of bond pads on a space transformer to the plurality of probe contactors on the probe contactor substrate through the hole in the probe contactor substrate.   
     
     
         9 . The method of  claim 8 , wherein the probe contactors are lithographically formed on the probe contactor substrate. 
     
     
         10 . The method of  claim 8 , wherein the space transformer is a multi-layer wiring board. 
     
     
         11 . The method of  claim 8 , further comprising coupling the space transformer to the probe contactor substrate. 
     
     
         12 . The method of  claim 8 , further comprising machining the probe contactor substrate to a desired thickness after the plurality of probe contactors have been formed on the probe contactor substrate. 
     
     
         13 . The method of  claim 8 , wherein each of the plurality of probe contactors are electrically coupled to a plurality of respective terminals, and each of the plurality of respective terminals are electrically coupled to a respective bond pad of the plurality of bond pads. 
     
     
         14 . The method of  claim 8 , wherein forming a hole comprises machining the hole through the probe contactor substrate after the plurality of probe contactors have been formed on the probe contactor substrate. 
     
     
         15 . A method of forming a probe head comprising:
 lithographically forming a plurality of probe contactors in a solution on a top side of a probe contactor substrate, the plurality of probe contactors being formed into at least two groups separated by a distance of at least 0.5 mm, each of the plurality of probe contactors being electrically coupled to a respective terminal of a plurality of terminals;   machining a bottom side of the probe contactor substrate such that the probe contactor substrate has a desired thickness;   etching at least one trough in the solution of the probe contactors to form an opening between two groups of probes;   forming a slot in the probe contactor substrate in approximately the same location as the trough;   releasing the plurality of probe contactors from the solution;   forming a plurality of bond pads on a top side of a space transformer;   coupling the top side of the space transformer to the bottom side of the probe contactor substrate such that the bond pads are accessible through the top side of the probe contactor substrate; and   electrically coupling the respective terminal of the plurality of terminals to a respective bond pad of the plurality of bond pads.   
     
     
         16 . The method of  claim 15 , wherein the probe contactor substrate is ceramic. 
     
     
         17 . The method of  claim 15 , wherein the space transformer is a multi-layer wiring board. 
     
     
         18 . The method of  claim 15 , wherein a wire bond electrically couples the plurality of bond pads to the plurality of respective terminals. 
     
     
         19 . The method of  claim 15 , wherein a conductive adhesive electrically couples the plurality of bond pads to the plurality of respective terminals.