Instrument and method for x-ray diffraction, fluorescence, and crystal texture analysis without sample preparation

Abstract

An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.

1 . An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation, comprising:
 a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate; and   a photon-counting X-ray imaging spectrometer disposed to receive X-ray photons output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to said collimated X-ray beam,   wherein the X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.   
     
     
         2 . An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation, comprising:
 a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate;   a photon-counting X-ray imaging spectrometer disposed to receive X-ray photons output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to said collimated X-ray beam, the X-ray photons comprising diffracted X-rays; and   a housing defining a vacuum chamber and a sample aperture, the sample aperture comprising an X-ray window disposed therein,   wherein the X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate,   wherein the X-ray source is disposed in the vacuum chamber at a first side of the housing and the photon-counting X-ray imaging spectrometer is disposed in the vacuum chamber at a second side of the housing or in another vacuum chamber at the second side of the housing, and   wherein said predetermined coordinate is adjacent an exterior of the X-ray window.   
     
     
         3 . An X-ray diffraction and X-ray fluorescence instrument according to  claim 2 ,
 wherein said photon-counting X-ray imaging spectrometer comprises a charge coupled device.   
     
     
         4 . An X-ray diffraction and X-ray fluorescence instrument according to  claim 2 , wherein said X-ray source comprises polycapillary optics. 
     
     
         5 . An X-ray diffraction and X-ray fluorescence instrument according to  claim 2 , wherein a position and orientation of said X-ray source and said photon-counting X-ray imaging spectrometer are fixed relative to one another.