Apparatus and method for measuring phase noise/jitter in devices under test

Abstract

A system for testing integrated circuit products and other devices under test (DUT) includes a DUT tester, which stimulates the devices under test and analyzes signals from the devices under test. A device interface board transports signals between the DUT tester and the devices under test. A test board is coupled to the device interface board and used to generate measurements associated with the devices under test, such as phase noise or phase jitter measurements. The test board could, for example, include a phase detector for detecting a phase difference between two signals and a control loop for adjusting at least one of the two signals to maintain an average of zero DC volts at an output of the phase detector. A customization module could also be used to customize the test board. The customization module could include a phase shifter, a phase-locked loop synthesizer, and/or an oscillator.

1 . A system comprising:
 a device interface board configured to transport signals between a product tester and a device under test; and   a test board coupled to the device interface board, the test board configured to receive a signal from the device under test through the device interface board, the test board also configured to generate one or more measurements associated with at least one characteristic of the device under test.   
     
     
         2 - 20 . (canceled)