Electrodes located at storage capacitor wiring in active matrix substrate

Abstract

The active matrix substrate of the present invention is the active matrix substrate in which the faulty connection in a storage capacitor element as caused by a short circuit between storage capacitor electrodes due to a conductive foreign material or a pinhole in an insulating layer or by a short circuit between a data signal line and a storage capacitor upper electrode can be repaired with ease. The active matrix substrate of the present invention is the active matrix substrate comprising a thin film transistor disposed at the crossing point of a scanning signal line with a data signal line on the substrate, with a gate electrode of the transistor being connected to the scanning signal line, a source electrode thereof being connected to the data signal line and a drain electrode thereof being connected to an interconnection electrode, and a storage capacitor upper electrode disposed so as to oppose a storage capacitor wiring pattern at least via an insulating layer and connected to the interconnection electrode and a pixel electrode, wherein the storage capacitor upper electrode comprises at least three divided electrodes in the region opposing the storage capacitor wiring pattern.

1 . An active matrix substrate comprising
 a thin film transistor disposed at the crossing point of a scanning signal line with a data signal line on the substrate, with a gate electrode of the transistor being connected to the scanning signal line, a source electrode thereof being connected to the data signal line and a drain electrode thereof being connected to a pixel electrode, and   a storage capacitor upper electrode disposed so as to oppose a storage capacitor wiring pattern at least via an insulating layer,   characterized in that the storage capacitor upper electrode comprises at least three divided electrodes in the region opposing the storage capacitor wiring pattern and in that each divided electrode is connected to the pixel electrode.