US2011070718A1PendingUtilityA1
Semiconductor device and method of fabricating the same
Est. expiryJun 8, 2026(expired)· nominal 20-yr term from priority
H10W 20/089H10D 84/00H10D 1/692H10B 12/00
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Abstract
A semiconductor device and methods of fabricating the same, wherein insulation layers are interposed to sequentially dispose the semiconductor device on a semiconductor substrate. The semiconductor device includes a first conductive plate, a second conductive plate, a third conductive plate, and a fourth conductive plate. At least two of the first, second, third and fourth conductive plates are electrically connected and constitute at least two capacitors.
Claims
exact text as granted — not AI-modified1 . A method of fabricating a semiconductor device comprising:
preparing a semiconductor substrate on which are formed a first conductive plate, a first bottom interconnection electrically connected to the first conductive plate, and a second bottom interconnection insulated from the first conductive plate; forming a second conductive plate with a first insulation layer interposed on the first conductive plate; forming a third conductive plate with a second insulation layer interposed on the second conductive plate; forming a third insulation layer on the semiconductor substrate; performing an etch process to form a first groove and a second groove, the first groove exposing the second bottom interconnection and the second conductive plate, and the second groove exposing the first bottom interconnection and the third conductive plate; and filling the first groove with conductive material to form a fourth conductive plate on the third conductive plate, wherein the first conductive plate and the third conductive plate are electrically connected, and the second conductive plate and the fourth conductive plate are electrically connected.
2 . The method of claim 1 , wherein forming the fourth conductive plate comprises:
forming a first top interconnection electrically connected to the fourth conductive plate and the second bottom interconnection in the first groove, and forming a second top interconnection electrically connected to the first bottom interconnection on the second groove.
3 . A method of fabricating a semiconductor device comprising:
preparing a semiconductor substrate on which are formed a first conductive plate, a first bottom interconnection electrically connected to the first conductive plate, and a second bottom interconnection insulated from the first conductive plate; forming a second conductive plate with a first insulation layer interposed on the first conductive plate; forming a third conductive plate with a second insulation layer interposed on the second conductive plate; forming a third insulation layer on the semiconductor substrate; performing an etch process to form a first groove and a second groove, the first groove exposing the second bottom interconnection and the second conductive plate, and the second groove exposing the first bottom interconnection and the third conductive plate; and filling the first groove with conductive material to form a fourth conductive plate on the third conductive plate, wherein the first conductive plate, the third conductive plate, and the fourth conductive plate are electrically connected.
4 . The method of claim 3 , wherein forming the fourth conductive plate comprises:
forming a second top interconnection electrically connected to the second bottom interconnection in the first groove, and forming a first top interconnection electrically connected to the fourth conductive plate and the first bottom interconnection in the second groove.
5 . A method of fabricating a semiconductor device comprising:
preparing a semiconductor substrate on which are formed a first conductive plate, a first bottom interconnection electrically connected to the first conductive plate, and a second bottom interconnection insulated from the first conductive plate; forming a second conductive plate with a first insulation layer interposed on the first conductive plate; forming a third conductive plate with a second insulation layer interposed on the second conductive plate; forming a third insulation layer on the semiconductor substrate; performing an etch process to form a first groove and a second groove, the first groove exposing the second bottom interconnection and the third conductive plate, and the second groove exposing the first bottom interconnection and the second conductive plate; and filling the first groove with conductive material to form a fourth conductive plate on the third conductive plate, wherein the first conductive plate, the second conductive plate, and the fourth conductive plate are electrically connected.
6 . The method of claim 5 wherein, forming the fourth conductive plate comprises:
forming a second top interconnection electrically connected to the second bottom in the first groove, and
forming a first top interconnection electrically connected to the fourth conductive plate and the first bottom interconnection in the second groove.Cited by (0)
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