US2011077145A1PendingUtilityA1

Excess enthalpy upon pressurization of nanosized metals with deuterium

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Assignee: KIDWELL DAVID APriority: Sep 29, 2009Filed: Sep 29, 2010Published: Mar 31, 2011
Est. expirySep 29, 2029(~3.2 yrs left)· nominal 20-yr term from priority
B01J 21/04B01J 23/42B01J 23/44B01J 23/63G01N 25/48B01J 29/04
49
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Claims

Abstract

A method for producing excess enthalpy by impregnating metallic precursors on an oxide support that reduces sintering and particle growth; drying the impregnated support at a temperature where the particle growth is minimal; reducing the metallic precursors at a second temperature where the particle growth results in supported metallic particles 2 nm or less in size; and pressurizing the supported metallic particles in the presence of deuterium. The metal particles may comprise palladium, platinum, mixtures thereof, or mixtures of palladium and/or platinum with other elements. Also disclosed is a method for measuring excess enthalpy by placing a test material in a pressure vessel; heating the pressure vessel; evacuating the pressure vessel; introducing deuterium, hydrogen, or both into the pressure vessel; measuring the enthalpy generated during pressurization; again evacuating the pressure vessel; and measuring the enthalpy used during depressurization.

Claims

exact text as granted — not AI-modified
1 . A method for producing excess enthalpy, comprising:
 impregnating metallic precursors on an oxide support that reduces sintering and particle growth;   drying the impregnated support at a temperature where the particle growth is minimal;   reducing the metallic precursors at a second temperature where the particle growth results in supported metallic particles 2 nm or less in size;   and pressurizing the supported metallic particles in the presence of deuterium.   
     
     
         2 . The method of  claim 1 , wherein the metallic precursors comprise palladium, platinum, or any combination thereof. 
     
     
         3 . The method of  claim 1 , wherein the oxide support is a zeolite or alumina. 
     
     
         4 . The method of  claim 1 , wherein the drying temperature is less than 500° C. 
     
     
         5 . The method of  claim 1 , wherein the drying temperature is less than 300° C. 
     
     
         6 . The method of  claim 1 , wherein the second temperature is less than 300° C. 
     
     
         7 . The method of  claim 1 , wherein there is low metal loading to reduce particle size. 
     
     
         8 . The method of  claim 1 , wherein the metallic particles are pressurized to 100 psi or below. 
     
     
         9 . The method of  claim 1 , wherein the metallic particles are pressurized to 50 psi or below. 
     
     
         10 . A system for measuring excess enthalpy, comprising:
 placing a test material in a pressure vessel;   heating the pressure vessel to a given temperature;   evacuating the pressure vessel;   introducing deuterium, hydrogen, or both into the pressure vessel;   measuring the enthalpy generated during pressurization;   again evacuating the pressure vessel; and   measuring the enthalpy used during depressurization.   
     
     
         11 . The system of  claim 10 , wherein the test material comprises dispersed metal particles 2 nm or less in size in an oxide support that reduces sintering and particle growth. 
     
     
         12 . The system of  claim 11 , wherein the metal particles comprise, palladium, platinum, or any combination thereof. 
     
     
         13 . The system of  claim 11 , wherein the oxide support is a zeolite or alumina. 
     
     
         14 . The system of  claim 10 , wherein the temperature is less than 300° C. 
     
     
         15 . The system of  claim 10 , wherein the temperature is less than 100° C. 
     
     
         16 . The system of  claim 10 , wherein, there is low metal loading to reduce particle size. 
     
     
         17 . The system of  claim 10 , wherein when the pressure vessel is again evacuated, all of the deuterium, hydrogen, or both that was introduced into the system is removed. 
     
     
         18 . The system of  claim 10 , wherein the test material is pressurized to 100 psi or below. 
     
     
         19 . The system of  claim 10 , wherein the test material is pressurized to 50 psi or below.

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